Yoshitaka Nagatsuka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron probe microanalyzer having wavelength-dispersive x-ray spe...
- Patent number 4,988,872
- Issue date Jan 29, 1991
- Jeol Ltd.
- Yoshitaka Nagatsuka
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum display device for x-ray microanalyzer or the like
- Patent number 4,885,465
- Issue date Dec 5, 1989
- Jeol, Ltd.
- Yoshitaka Nagatsuka
- G01 - MEASURING TESTING