Yoshitaka NISHIHARA

Person

Chichibu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
SiC epitaxial wafer, and method of manufacturing the same
- Patent number 12,266,693
- Issue date Apr 1, 2025
- Resonac Corporation
- Yoshitaka Nishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation method and manufacturing method of SiC epitaxial wafer
- Patent number 11,315,839
- Issue date Apr 26, 2022
- Showa Denko K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
SiC substrate evaluation method and method for manufacturing SiC ep...
- Patent number 11,249,027
- Issue date Feb 15, 2022
- Showa Denko K.K.
- Yoshitaka Nishihara
- G01 - MEASURING TESTING
Information Patent Grant
SiC substrate, SiC epitaxial wafer, and method of manufacturing the...
- Patent number 10,985,042
- Issue date Apr 20, 2021
- Showa Denko K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of manufacturing SiC epitaxial wafer
- Patent number 10,985,079
- Issue date Apr 20, 2021
- Showa Denko K.K.
- Yoshitaka Nishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SiC substrate evaluation method and method for manufacturing SiC ep...
- Patent number 10,697,898
- Issue date Jun 30, 2020
- Showa Denko K.K.
- Yoshitaka Nishihara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SiC INGOT AND SiC WAFER
- Publication number 20230122232
- Publication date Apr 20, 2023
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230055999
- Publication date Feb 23, 2023
- SHOWA DENKO K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Application
EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER
- Publication number 20220223482
- Publication date Jul 14, 2022
- SHOWA DENKO K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR MANUFACTURING SiC EPITAXIAL WAFER
- Publication number 20200388492
- Publication date Dec 10, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SIC EP...
- Publication number 20200284732
- Publication date Sep 10, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE SAME
- Publication number 20200251561
- Publication date Aug 6, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SIC EPITAXIAL WAFER
- Publication number 20200152528
- Publication date May 14, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SiC SUBSTRATE, SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE...
- Publication number 20200118854
- Publication date Apr 16, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SiC EP...
- Publication number 20200116649
- Publication date Apr 16, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER
- Publication number 20190172758
- Publication date Jun 6, 2019
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS

Yoshitaka NISHIHARA

Person

Patents Grantslast 30 patents

SiC epitaxial wafer, and method of manufacturing the same

Evaluation method and manufacturing method of SiC epitaxial wafer

SiC substrate evaluation method and method for manufacturing SiC ep...

SiC substrate, SiC epitaxial wafer, and method of manufacturing the...

Method of manufacturing SiC epitaxial wafer

SiC substrate evaluation method and method for manufacturing SiC ep...

Patents Applicationslast 30 patents

SiC INGOT AND SiC WAFER

SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE SAME

EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER

METHOD FOR MANUFACTURING SiC EPITAXIAL WAFER

SIC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SIC EP...

SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE SAME

METHOD OF MANUFACTURING SIC EPITAXIAL WAFER

SiC SUBSTRATE, SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE...

SiC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SiC EP...

EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER