Yoshitomo Shintani

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Aichi-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring defect density of single crystal
- Patent number 8,831,910
- Issue date Sep 9, 2014
- Toyota Jidosha Kabushiki Kaisha
- Yoshitomo Shintani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING DEFECT DENSITY OF SINGLE CRYSTAL
- Publication number 20120016630
- Publication date Jan 19, 2012
- Toyota Jidosha Kabushiki Kaisha
- Yoshitomo Shintani
- G02 - OPTICS