TREA

Yoshitsugu Inaba

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 7,554,173
    • Issue date Jun 30, 2009
    • Mitsubishi Electric Corporation
    • Takashi Inaguchi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Semiconductor Device
    • Publication number 20080006897
    • Publication date Jan 10, 2008
    • MITSUBISHI ELECTRIC CORPORATION
    • Takashi Inaguchi
    • G01 - MEASURING TESTING