Yoshitsugu UEKUSA

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Tachikawa-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning mechanism and scanning probe microscope
- Patent number 9,625,491
- Issue date Apr 18, 2017
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,482,690
- Issue date Nov 1, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Compound microscope
- Patent number 9,347,969
- Issue date May 24, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED...
- Publication number 20190011478
- Publication date Jan 10, 2019
- OLYMPUS CORPORATION
- Yoshitsugu UEKUSA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE
- Publication number 20150153385
- Publication date Jun 4, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150135374
- Publication date May 14, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...
- Publication number 20150047080
- Publication date Feb 12, 2015
- OLYMPUS CORPORATION
- Akira YAGI
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE
- Publication number 20150040273
- Publication date Feb 5, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING