Yoshiyasu Ito

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, apparatus, and program
- Patent number 11,131,637
- Issue date Sep 28, 2021
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,079,345
- Issue date Aug 3, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid inspection system
- Patent number 10,983,073
- Issue date Apr 20, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
- Patent number 10,876,978
- Issue date Dec 29, 2020
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,514,345
- Issue date Dec 24, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Electrical power storage system using hydrogen and method for stori...
- Patent number 9,362,576
- Issue date Jun 7, 2016
- Kabushiki Kaisha Toshiba
- Shoko Suyama
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Ceramics composite member and method of producing the same
- Patent number 8,956,482
- Issue date Feb 17, 2015
- Kabushiki Kaisha Toshiba
- Shoko Suyama
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Surface microstructure measurement method, surface microstructure m...
- Patent number 8,908,830
- Issue date Dec 9, 2014
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 8,444,281
- Issue date May 21, 2013
- NEC Toshiba Space Systems, Ltd.
- Katsuhiko Tsuno
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Electrical power storage system using hydrogen and method for stori...
- Patent number 8,394,543
- Issue date Mar 12, 2013
- Kabushiki Kaisha Toshiba
- Shoko Suyama
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Sputtering target, optical thin film and manufacturing method there...
- Patent number 7,510,990
- Issue date Mar 31, 2009
- Kabushiki Kaisha Toshiba
- Yasuhiro Satoh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for void content measurement and method and ap...
- Patent number 7,474,734
- Issue date Jan 6, 2009
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic porous material
- Patent number 7,361,272
- Issue date Apr 22, 2008
- Kabushiki Kaisha Toshiba
- Tsuneji Kameda
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Method for measuring dead time of X-ray detector
- Patent number 7,342,997
- Issue date Mar 11, 2008
- Rigaku Corporation
- Tomoyasu Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for void content measurement and method and ap...
- Patent number 7,272,206
- Issue date Sep 18, 2007
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing membrane structure and apparatus therefor
- Patent number 7,248,669
- Issue date Jul 24, 2007
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing analysis using propagation rays and apparatus...
- Patent number 7,098,459
- Issue date Aug 29, 2006
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Mirror substrate, mirror body using the same, and optical device us...
- Patent number 7,080,915
- Issue date Jul 25, 2006
- NEC Toshiba Space Systems, Ltd.
- Katsuhiko Tsuno
- G02 - OPTICS
Information Patent Grant
Method for analyzing film structure and apparatus therefor
- Patent number 7,039,161
- Issue date May 2, 2006
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Density-nonuniform multilayer film analyzing method, and apparatus...
- Patent number 6,920,200
- Issue date Jul 19, 2005
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Current/voltage non-linear resistor and sintered body therefor
- Patent number 6,627,100
- Issue date Sep 30, 2003
- Kabushiki Kaisha Toshiba
- Hideyasu Ando
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240328972
- Publication date Oct 3, 2024
- Rigaku Corporation
- Rieko SUENAGA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20210063326
- Publication date Mar 4, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR FINE STRUCTURE, APPARATUS, AND PROGRAM
- Publication number 20200333268
- Publication date Oct 22, 2020
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR FINE STRUCTURE, AND APPARATUS AND PROGRAM THEREOF
- Publication number 20200333267
- Publication date Oct 22, 2020
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTION SYSTEM
- Publication number 20190227006
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...
- Publication number 20190227005
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170299528
- Publication date Oct 19, 2017
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL POWER STORAGE SYSTEM USING HYDROGEN AND METHOD FOR STORI...
- Publication number 20130344411
- Publication date Dec 26, 2013
- Shoko SUYAMA
- B32 - LAYERED PRODUCTS
Information Patent Application
CERAMICS COMPOSITE MEMBER AND METHOD OF PRODUCING THE SAME
- Publication number 20120267339
- Publication date Oct 25, 2012
- Kabushiki Kaisha Toshiba
- Shoko SUYAMA
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
ELECTRICAL POWER STORAGE SYSTEM USING HYDROGEN AND METHOD FOR STORI...
- Publication number 20120208100
- Publication date Aug 16, 2012
- Kabushiki Kaisha Toshiba
- Shoko SUYAMA
- B32 - LAYERED PRODUCTS
Information Patent Application
Optical device
- Publication number 20100309570
- Publication date Dec 9, 2010
- C/O NEC TOSHIBA SPACE SYSTEMS, LTD.
- Katsuhiko Tsuno
- G02 - OPTICS
Information Patent Application
HEAT RESISTANT MEMBER
- Publication number 20080199711
- Publication date Aug 21, 2008
- Kabushiki Kaisha Toshiba
- Yutaka ISHIWATA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CERAMICS COMPOSITE MEMBER AND METHOD OF PRODUCING THE SAME
- Publication number 20080131665
- Publication date Jun 5, 2008
- Shoko Suyama
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
METHOD AND APPARATUS FOR VOID CONTENT MEASUREMENT AND METHOD AND AP...
- Publication number 20080002812
- Publication date Jan 3, 2008
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic porous material
- Publication number 20070104941
- Publication date May 10, 2007
- Kabushiki Kaisha Toshiba
- Tsuneji Kameda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Sputtering target, optical thin film and manufacturing method there...
- Publication number 20070031633
- Publication date Feb 8, 2007
- Kabushiki Kaisha Toshiba
- Yasuhiro Satoh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for measuring dead time of X-ray detector
- Publication number 20060285642
- Publication date Dec 21, 2006
- Rigaku Corporation
- Tomoyasu Ueda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for void content measurement and method and ap...
- Publication number 20050195940
- Publication date Sep 8, 2005
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing film structure and apparatus therefor
- Publication number 20050105686
- Publication date May 19, 2005
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing membrane structure and apparatus therefor
- Publication number 20050102110
- Publication date May 12, 2005
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Application
Mirror substrate, mirror body using the same, and optical device us...
- Publication number 20040246610
- Publication date Dec 9, 2004
- NEC TOSHIBA Space Systems, Ltd.
- Katsuhiko Tsuno
- G02 - OPTICS
Information Patent Application
Density-nonuniform multilayer film analyzing method, and apparatus...
- Publication number 20040066893
- Publication date Apr 8, 2004
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Application
Method of performing analysis using propagation rays and apparatus...
- Publication number 20030231737
- Publication date Dec 18, 2003
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
Current/voltage non-linear resistor and sintered body therefor
- Publication number 20020121960
- Publication date Sep 5, 2002
- KABUSHIKI KAISHA TOSHIBA
- Hideyasu Ando
- H01 - BASIC ELECTRIC ELEMENTS

Yoshiyasu Ito

Person

Patents Grantslast 30 patents

Transmissive small-angle scattering device

Transmissive small-angle scattering device

Analysis method for fine structure, and apparatus and program thereof

Analysis method for fine structure, apparatus, and program

X-ray inspection device

Hybrid inspection system

X-ray inspecting device, X-ray thin film inspecting method, and met...

X-ray thin film inspection device

X-ray thin film inspection device

Electrical power storage system using hydrogen and method for stori...

Ceramics composite member and method of producing the same

Surface microstructure measurement method, surface microstructure m...

Optical device

Electrical power storage system using hydrogen and method for stori...

Sputtering target, optical thin film and manufacturing method there...

Method and apparatus for void content measurement and method and ap...

Anisotropic porous material

Method for measuring dead time of X-ray detector

Method and apparatus for void content measurement and method and ap...

Method for analyzing membrane structure and apparatus therefor

Method of performing analysis using propagation rays and apparatus...

Mirror substrate, mirror body using the same, and optical device us...

Method for analyzing film structure and apparatus therefor

Density-nonuniform multilayer film analyzing method, and apparatus...

Current/voltage non-linear resistor and sintered body therefor

Patents Applicationslast 30 patents

ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

X-RAY INSPECTION DEVICE

ANALYSIS METHOD FOR FINE STRUCTURE, APPARATUS, AND PROGRAM

ANALYSIS METHOD FOR FINE STRUCTURE, AND APPARATUS AND PROGRAM THEREOF

HYBRID INSPECTION SYSTEM

X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...

X-RAY THIN FILM INSPECTION DEVICE

X-RAY THIN FILM INSPECTION DEVICE

ELECTRICAL POWER STORAGE SYSTEM USING HYDROGEN AND METHOD FOR STORI...

CERAMICS COMPOSITE MEMBER AND METHOD OF PRODUCING THE SAME

ELECTRICAL POWER STORAGE SYSTEM USING HYDROGEN AND METHOD FOR STORI...

Optical device

HEAT RESISTANT MEMBER

CERAMICS COMPOSITE MEMBER AND METHOD OF PRODUCING THE SAME

METHOD AND APPARATUS FOR VOID CONTENT MEASUREMENT AND METHOD AND AP...

Anisotropic porous material

Sputtering target, optical thin film and manufacturing method there...

Method for measuring dead time of X-ray detector

Method and apparatus for void content measurement and method and ap...

Method for analyzing film structure and apparatus therefor

Method for analyzing membrane structure and apparatus therefor

Mirror substrate, mirror body using the same, and optical device us...

Density-nonuniform multilayer film analyzing method, and apparatus...

Method of performing analysis using propagation rays and apparatus...

Current/voltage non-linear resistor and sintered body therefor