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Yoshiyuki FUKAMI
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Ibaraki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Multilayer wiring base plate and probe card using the same
Patent number
11,099,227
Issue date
Aug 24, 2021
Kabushiki Kaisha Nihon Micronics
Noboru Otabe
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
10,989,738
Issue date
Apr 27, 2021
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
10,705,122
Issue date
Jul 7, 2020
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Probe card with temperature control function, inspection apparatus...
Patent number
10,295,590
Issue date
May 21, 2019
Kabushiki Kaisha Nihon Micronics
Yuki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
9,535,108
Issue date
Jan 3, 2017
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method for inspecting a wiring...
Patent number
9,476,934
Issue date
Oct 25, 2016
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer wiring board and method for manufacturing the same
Patent number
9,095,071
Issue date
Jul 28, 2015
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Contactor for electrical test, electrical connecting apparatus usin...
Patent number
7,960,988
Issue date
Jun 14, 2011
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BLOOD VESSEL SPECIFYING DEVICE AND BLOOD VESSEL SPECIFYING METHOD
Publication number
20220257874
Publication date
Aug 18, 2022
Kabushiki Kaisha Nihon Micronics
Yuki SAITO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BLOOD VESSEL POSITION DISPLAY DEVICE AND BLOOD VESSEL POSITION DISP...
Publication number
20220249016
Publication date
Aug 11, 2022
Kabushiki Kaisha Nihon Micronics
Yuki SAITO
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ELECTRICAL CONNECTING APPARATUS
Publication number
20220149549
Publication date
May 12, 2022
Kabushiki Kaisha Nihon Micronics
Shou HARAKO
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER WIRING BASE PLATE AND PROBE CARD USING THE SAME
Publication number
20200400739
Publication date
Dec 24, 2020
Kabushiki Kaisha Nihon Micronics
Noboru OTABE
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20200064374
Publication date
Feb 27, 2020
Kabushiki Kaisha Nihon Micronics
YOSHIYUKI FUKAMI
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD
Publication number
20190154730
Publication date
May 23, 2019
Kabushiki Kaisha Nihon Micronics
Yoshiyuki FUKAMI
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD WITH TEMPERATURE CONTROL FUNCTION, INSPECTION DEVICE USI...
Publication number
20170363680
Publication date
Dec 21, 2017
Kabushiki Kaisha Nihon Micronics
Yuki SAITO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20150108997
Publication date
Apr 23, 2015
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTING A WIRING...
Publication number
20140375351
Publication date
Dec 25, 2014
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER WIRING BOARD AND METHOD FOR MANUFACTURING THE SAME
Publication number
20140138139
Publication date
May 22, 2014
Kabushiki Kaisha Nihon Micronics
Yoshiyuki FUKAMI
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USIN...
Publication number
20090160473
Publication date
Jun 25, 2009
Kabushiki Kaisha Nihon Micronics
Yoshiyuki FUKAMI
G01 - MEASURING TESTING