Yoshiyuki Hanada

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect distribution pattern comparison method and system
- Patent number 8,131,057
- Issue date Mar 6, 2012
- Tokyo Electron Limited
- Yoshiyuki Hanada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20240290609
- Publication date Aug 29, 2024
- Tokyo Electron Limited
- Tadahiro ISHIZAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM DEPOSITION DEVICE AND SUBSTRATE PROCESSING DEVICE
- Publication number 20110265725
- Publication date Nov 3, 2011
- TOKYO ELECTRON LIMITED
- Norihiko Tsuji
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR MATCHING DEFECT DISTRIBUTION PATTERN
- Publication number 20090316980
- Publication date Dec 24, 2009
- TOKYO ELECTRON LIMITED
- Yoshiyuki Hanada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CERAMIC MEMBER, CERAMIC HEATER, SUBSTRATE PLACING MECHANISM, SUBSTR...
- Publication number 20090241837
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Yoshiyuki Hanada
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
Gas supply device and treating device
- Publication number 20050255241
- Publication date Nov 17, 2005
- TOKYO ELECTRON LIMITED
- Seishi Murakami
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...