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Yoshiyuki Kataoka
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Takatsuki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,832,981
Issue date
Dec 5, 2023
Rigaku Corporation
Yoshiyuki Kataoka
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
Patent number
11,782,000
Issue date
Oct 10, 2023
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
Patent number
11,698,353
Issue date
Jul 11, 2023
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,513,086
Issue date
Nov 29, 2022
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,402,343
Issue date
Aug 2, 2022
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength dispersive X-ray fluorescence spectrometer
Patent number
10,948,436
Issue date
Mar 16, 2021
Rigaku Corporation
Shuichi Kato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analysis method, X-ray fluorescence analysis pro...
Patent number
10,921,267
Issue date
Feb 16, 2021
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength dispersive x-ray fluorescence spectrometer and x-ray flu...
Patent number
10,768,125
Issue date
Sep 8, 2020
Rigaku Corporation
Shuichi Kato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
10,161,889
Issue date
Dec 25, 2018
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
10,082,475
Issue date
Sep 25, 2018
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength dispersive X-ray fluorescence spectrometer
Patent number
8,774,356
Issue date
Jul 8, 2014
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzing method
Patent number
8,433,035
Issue date
Apr 30, 2013
Rigaku Corporation
Kenji Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
7,949,093
Issue date
May 24, 2011
Rigaku Industrial Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer and program for use therewith
Patent number
7,450,685
Issue date
Nov 11, 2008
Rigaku Industrial Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
7,356,114
Issue date
Apr 8, 2008
Rigaku Industrial Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
6,668,038
Issue date
Dec 23, 2003
Rigaku Industrial Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20230293129
Publication date
Sep 21, 2023
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Application
QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-...
Publication number
20230060446
Publication date
Mar 2, 2023
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20220260506
Publication date
Aug 18, 2022
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20220178853
Publication date
Jun 9, 2022
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYSIS METHOD, X-RAY FLUORESCENCE ANALYSIS PRO...
Publication number
20200003712
Publication date
Jan 2, 2020
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
Publication number
20190227008
Publication date
Jul 25, 2019
Rigaku Corporation
Shuichi KATO
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLU...
Publication number
20190072504
Publication date
Mar 7, 2019
Rigaku Corporation
Shuichi KATO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20180180563
Publication date
Jun 28, 2018
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20180106736
Publication date
Apr 19, 2018
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
Publication number
20130294577
Publication date
Nov 7, 2013
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZING METHOD
Publication number
20110243301
Publication date
Oct 6, 2011
Rigaku Corporation
Kenji Watanabe
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20090116613
Publication date
May 7, 2009
RIGAKU INDUSTRIAL CORPORATION
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Application
X-ray fluorescence spectrometer and program for use therewith
Publication number
20070086567
Publication date
Apr 19, 2007
RIGAKU INDUSTRIAL CORPORATION
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20070058776
Publication date
Mar 15, 2007
RIGAKU INDUSTRIAL CORPORATION
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
X-ray fluorescense spectrometer
Publication number
20030118148
Publication date
Jun 26, 2003
RIGAKU INDUSTRIAL CORPORATION
Yoshiyuki Kataoka
G01 - MEASURING TESTING