Yoshiyuki Kuramoto

Person

Utsunomiya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus
- Patent number 10,018,722
- Issue date Jul 10, 2018
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus including multi-wavelength interferometer
- Patent number 9,372,068
- Issue date Jun 21, 2016
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus, and method of manufacturing article
- Patent number 9,297,745
- Issue date Mar 29, 2016
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus to calculate wavefront aberration of optical...
- Patent number 9,175,953
- Issue date Nov 3, 2015
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 9,115,971
- Issue date Aug 25, 2015
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 8,830,480
- Issue date Sep 9, 2014
- Canon Kabushiki Kaisha
- Taro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 8,797,542
- Issue date Aug 5, 2014
- Canon Kabushiki Kaisha
- Takumi Tokimitsu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and distance calculation method therefor
- Patent number 8,724,114
- Issue date May 13, 2014
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, exposure apparatus, and device fabrication m...
- Patent number 8,692,975
- Issue date Apr 8, 2014
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer
- Patent number 8,576,404
- Issue date Nov 5, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,559,015
- Issue date Oct 15, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, exposure apparatus, and device manufacturing...
- Patent number 8,542,345
- Issue date Sep 24, 2013
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Lightwave interference measurement apparatus that calculates absolu...
- Patent number 8,502,986
- Issue date Aug 6, 2013
- Canon Kabushiki Kaisha
- Yusuke Koda
- G01 - MEASURING TESTING
Information Patent Grant
Lightwave interference measurement apparatus used to measure optica...
- Patent number 8,416,422
- Issue date Apr 9, 2013
- Canon Kabushiki Kaisha
- Takamasa Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference measuring apparatus
- Patent number 8,363,226
- Issue date Jan 29, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric distance measurement with harmonic frequency comb g...
- Patent number 8,339,611
- Issue date Dec 25, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for measuring an aberration of an optical sys...
- Patent number 8,243,256
- Issue date Aug 14, 2012
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and exposure apparatus
- Patent number 8,174,670
- Issue date May 8, 2012
- Canon Kabushiki Kaisha
- Taro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, optical system manufacturing method, exposure...
- Patent number 8,174,675
- Issue date May 8, 2012
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method, measurement apparatus, exposure apparatus, and...
- Patent number 7,995,213
- Issue date Aug 9, 2011
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Injection-locked laser, interferometer, exposure apparatus, and dev...
- Patent number 7,910,871
- Issue date Mar 22, 2011
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatuses and methods using measurement of a flare generated in a...
- Patent number 7,907,263
- Issue date Mar 15, 2011
- Canon Kabushiki Kaisha
- Michiko Aizawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection exposure apparatus, optical member, and device manufactu...
- Patent number 7,787,103
- Issue date Aug 31, 2010
- Canon Kabushiki Kaisha
- Shinichiro Hirai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring wavefront retardance aberration based on wavefr...
- Patent number 7,773,233
- Issue date Aug 10, 2010
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Injection-locked pulsed laser with high wavelength stability
- Patent number 7,608,808
- Issue date Oct 27, 2009
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and a measuring method for measuring a polariza...
- Patent number 7,548,077
- Issue date Jun 16, 2009
- Canon Kabushiki Kaisha
- Naoto Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 7,532,019
- Issue date May 12, 2009
- Canon Kabushiki Kaisha
- Naoto Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, exposure apparatus and device manufacturing me...
- Patent number 7,276,717
- Issue date Oct 2, 2007
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aberration measuring apparatus comprising wavelength calibration an...
- Patent number 7,161,681
- Issue date Jan 9, 2007
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system for measuring performance of imaging optical system
- Patent number 6,937,345
- Issue date Aug 30, 2005
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS, SYSTEM, AND METHOD OF MANUFACTURING ARTICLE
- Publication number 20160354881
- Publication date Dec 8, 2016
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20160266255
- Publication date Sep 15, 2016
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASURING METHOD AND IMAGE MEASURING APPARATUS
- Publication number 20160238380
- Publication date Aug 18, 2016
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND METHOD OF MANUFACTUR...
- Publication number 20150253128
- Publication date Sep 10, 2015
- Canon Kabushiki Kaisha
- Takanori Uemura
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, AND METHOD OF MANUFACTURING ARTICLE
- Publication number 20150131096
- Publication date May 14, 2015
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20150057972
- Publication date Feb 26, 2015
- Canon Kabushiki Kaisha
- Hideaki Kitamura
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20140182150
- Publication date Jul 3, 2014
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS INCLUDING MULTI-WAVELENGTH INTERFEROMETER
- Publication number 20130155414
- Publication date Jun 20, 2013
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20130063728
- Publication date Mar 14, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR
- Publication number 20120127477
- Publication date May 24, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20120116718
- Publication date May 10, 2012
- Canon Kabushiki Kaisha
- Taro TEZUKA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20120113434
- Publication date May 10, 2012
- Canon Kabushiki Kaisha
- Takumi TOKIMITSU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETER
- Publication number 20120044500
- Publication date Feb 23, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki KURAMOTO
- G01 - MEASURING TESTING
Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS USED TO MEASURE OPTICA...
- Publication number 20110216326
- Publication date Sep 8, 2011
- Canon Kabushiki Kaisha
- Takamasa SASAKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS THAT CALCULATES ABSOLU...
- Publication number 20110211198
- Publication date Sep 1, 2011
- Canon Kabushiki Kaisha
- Yusuke Koda
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
- Publication number 20110134408
- Publication date Jun 9, 2011
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20110102805
- Publication date May 5, 2011
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, OPTICAL SYSTEM MANUFACTURING METHOD, EXPOSURE...
- Publication number 20110027723
- Publication date Feb 3, 2011
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...
- Publication number 20100265515
- Publication date Oct 21, 2010
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND METHOD OF MANUFACTUR...
- Publication number 20100233636
- Publication date Sep 16, 2010
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS
- Publication number 20100225924
- Publication date Sep 9, 2010
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20100110444
- Publication date May 6, 2010
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING...
- Publication number 20100068634
- Publication date Mar 18, 2010
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS USING MEASUREMENT OF A FLARE GENERATED IN A...
- Publication number 20100002243
- Publication date Jan 7, 2010
- Canon Kabushiki Kaisha
- Michiko Aizawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INJECTION-LOCKED LASER, INTERFEROMETER, EXPOSURE APPARATUS, AND DEV...
- Publication number 20090316123
- Publication date Dec 24, 2009
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, EXPOSURE APPARATUS, AND...
- Publication number 20090296059
- Publication date Dec 3, 2009
- Canon Kabushiki Kaisha
- Takeshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND EXPOSURE APPARATUS
- Publication number 20090268181
- Publication date Oct 29, 2009
- Canon Kabushiki Kaisha
- Taro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...
- Publication number 20090257037
- Publication date Oct 15, 2009
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...
- Publication number 20080273200
- Publication date Nov 6, 2008
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INJECTION-LOCKED LASER, INTERFEROMETER, EXPOSURE APPARATUS, AND DEV...
- Publication number 20080106720
- Publication date May 8, 2008
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Yoshiyuki Kuramoto

Person

Patents Grantslast 30 patents

Measurement apparatus

Measuring apparatus including multi-wavelength interferometer

Shape measuring apparatus, and method of manufacturing article

Measurement apparatus to calculate wavefront aberration of optical...

Measuring apparatus

Measurement apparatus

Measurement apparatus

Interferometer and distance calculation method therefor

Measurement apparatus, exposure apparatus, and device fabrication m...

Optical interferometer

Measuring apparatus

Measurement apparatus, exposure apparatus, and device manufacturing...

Lightwave interference measurement apparatus that calculates absolu...

Lightwave interference measurement apparatus used to measure optica...

Optical interference measuring apparatus

Interferometric distance measurement with harmonic frequency comb g...

Measurement apparatus for measuring an aberration of an optical sys...

Measurement method and exposure apparatus

Measuring apparatus, optical system manufacturing method, exposure...

Measurement method, measurement apparatus, exposure apparatus, and...

Injection-locked laser, interferometer, exposure apparatus, and dev...

Apparatuses and methods using measurement of a flare generated in a...

Projection exposure apparatus, optical member, and device manufactu...

Method of measuring wavefront retardance aberration based on wavefr...

Injection-locked pulsed laser with high wavelength stability

Measuring apparatus and a measuring method for measuring a polariza...

Measuring apparatus and measuring method

Measuring apparatus, exposure apparatus and device manufacturing me...

Aberration measuring apparatus comprising wavelength calibration an...

Measuring system for measuring performance of imaging optical system

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS, SYSTEM, AND METHOD OF MANUFACTURING ARTICLE

MEASUREMENT APPARATUS

IMAGE MEASURING METHOD AND IMAGE MEASURING APPARATUS

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND METHOD OF MANUFACTUR...

MEASURING APPARATUS, AND METHOD OF MANUFACTURING ARTICLE

MEASURING APPARATUS AND MEASURING METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

MEASURING APPARATUS INCLUDING MULTI-WAVELENGTH INTERFEROMETER

MEASURING APPARATUS

INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR

MEASUREMENT APPARATUS

MEASUREMENT APPARATUS

OPTICAL INTERFEROMETER

LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS USED TO MEASURE OPTICA...

LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS THAT CALCULATES ABSOLU...

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...

MEASURING APPARATUS

MEASURING APPARATUS, OPTICAL SYSTEM MANUFACTURING METHOD, EXPOSURE...

MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND METHOD OF MANUFACTUR...

OPTICAL INTERFERENCE MEASURING APPARATUS

MEASUREMENT APPARATUS

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING...

APPARATUSES AND METHODS USING MEASUREMENT OF A FLARE GENERATED IN A...

INJECTION-LOCKED LASER, INTERFEROMETER, EXPOSURE APPARATUS, AND DEV...

MEASUREMENT APPARATUS, MEASUREMENT METHOD, EXPOSURE APPARATUS, AND...

MEASUREMENT METHOD AND EXPOSURE APPARATUS

MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...

MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND...

INJECTION-LOCKED LASER, INTERFEROMETER, EXPOSURE APPARATUS, AND DEV...