Yoshiyuki Masuo

Follow

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device test apparatus and method of configuring electron...
- Patent number 7,919,974
- Issue date Apr 5, 2011
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and a test tray for use in t...
- Patent number 6,856,128
- Issue date Feb 15, 2005
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Tester for semiconductor devices and test tray used for the same
- Patent number 6,459,259
- Issue date Oct 1, 2002
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,384,593
- Issue date May 7, 2002
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
IC pickup, IC carrier and IC testing apparatus using the same
- Patent number 6,384,360
- Issue date May 7, 2002
- Advantest Corporation
- Yoshiyuki Masuo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,183
- Issue date Aug 15, 2000
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOVEMENT APPARATUS AND ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090189631
- Publication date Jul 30, 2009
- Advantest Corporation
- Kenichi Shimada
- G01 - MEASURING TESTING
Information Patent Application
ADAPTER AND INTERFACE AND ELECTRONIC DEVICE TEST APPARATUS PROVIDED...
- Publication number 20090027060
- Publication date Jan 29, 2009
- Advantest Corporation
- Daisuke Takano
- G01 - MEASURING TESTING
Information Patent Application
Pick-And-Place Mechanism Of Electronic Device, Electronic Device Ha...
- Publication number 20080074118
- Publication date Mar 27, 2008
- Advantest Corporation
- Yoshiyuki Masuo
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Test Apparatus and Method of Configuring Electron...
- Publication number 20080042667
- Publication date Feb 21, 2008
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
TESTER FOR SEMICONDUCTOR DEVICES AND TEST TRAY USED FOR THE SAME
- Publication number 20020135356
- Publication date Sep 26, 2002
- AKIHIKO ITO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and a test tray for use in t...
- Publication number 20020011836
- Publication date Jan 31, 2002
- Akihiko Ito
- G01 - MEASURING TESTING