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Yoshiyuki Momiyama
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Hitachinaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Image processing unit for wafer inspection tool
Patent number
7,889,911
Issue date
Feb 15, 2011
Hitachi High-Technologies Corporation
Michio Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing unit for wafer inspection tool
Patent number
7,421,110
Issue date
Sep 2, 2008
Hitachi High-Technologies Corporation
Michio Nakano
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Semiconductor Inspecting Apparatus
Publication number
20130136334
Publication date
May 30, 2013
Hitachi High-Technologies Corporation
Yuichi Sakurai
G01 - MEASURING TESTING
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Patent Application
OPTICAL INSPECTION APPARATUS AND EDGE INSPECTION DEVICE
Publication number
20130100441
Publication date
Apr 25, 2013
Hitachi High-Technologies Corporation
Yuta TAGAWA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING UNIT FOR WAFER INSPECTION TOOL
Publication number
20080285841
Publication date
Nov 20, 2008
Michio Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image processing unit for wafer inspection tool
Publication number
20040170313
Publication date
Sep 2, 2004
Michio Nakano
G06 - COMPUTING CALCULATING COUNTING