Yoshiyuki Nag-No

Follow

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
- Patent number 7,388,199
- Issue date Jun 17, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Takafumi Morimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe manufacturing method, probe, and scanning probe microsope
- Publication number 20060284084
- Publication date Dec 21, 2006
- Takafumi Morimoto
- G01 - MEASURING TESTING