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Yoshiyuki Nakagawa
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Kyoto, JP
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Patents Grants
last 30 patents
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Patent Grant
Processing apparatus which performs predetermined processing while...
Patent number
7,527,692
Issue date
May 5, 2009
National Institute of Advanced Industrial Science and Technology
Yoshiyuki Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
Probing apparatus for measuring electrical characteristics of semic...
Patent number
4,746,857
Issue date
May 24, 1988
Danippon Screen Mfg. Co. Ltd.
Takamasa Sakai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Processing apparatus which performs predetermined processing while...
Publication number
20050212837
Publication date
Sep 29, 2005
Yoshiyuki Nakagawa
C40 - COMBINATORIAL CHEMISTRY