Yoshiyuki NAKAJIMA

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Multiple reflection type cell and analyzer
- Patent number 10,101,264
- Issue date Oct 16, 2018
- Horiba Ltd.
- Takeshi Akamatsu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection apparatus for X-ray fluorescence analysis
- Patent number 9,116,106
- Issue date Aug 25, 2015
- Horiba, Ltd.
- Satoru Goto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and method
- Patent number 7,327,444
- Issue date Feb 5, 2008
- Horiba, Ltd.
- Nobuyuki Naka
- G01 - MEASURING TESTING
Information Patent Grant
Sensitivity-calibration circuit for an HC analyzer
- Patent number 4,726,216
- Issue date Feb 23, 1988
- Horiba, Ltd.
- Hiroji Kohsaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE REFLECTION TYPE CELL AND ANALYZER
- Publication number 20170284929
- Publication date Oct 5, 2017
- Horiba, Ltd.
- Takeshi AKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION APPARATUS
- Publication number 20130272497
- Publication date Oct 17, 2013
- Horiba, Ltd.
- Satoru GOTO
- G01 - MEASURING TESTING
Information Patent Application
Substrate inspection apparatus and method
- Publication number 20060038980
- Publication date Feb 23, 2006
- Nobuyuki Naka
- G01 - MEASURING TESTING