Yoshiyuki NOGUCHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image processing device, analysis device, image processing method,...
- Patent number 11,867,691
- Issue date Jan 9, 2024
- Nikon Corporation
- Kenta Imai
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device, analysis method, analysis program and display device
- Patent number 11,645,859
- Issue date May 9, 2023
- Nikon Corporation
- Takuro Saigo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device, analysis program, and analysis method
- Patent number 11,379,983
- Issue date Jul 5, 2022
- Nikon Corporation
- Takuro Saigo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image-processing device, image-processing method, and image-process...
- Patent number 11,321,836
- Issue date May 3, 2022
- Nikon Corporation
- Mamiko Masutani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device, analysis method, and program
- Patent number 10,990,798
- Issue date Apr 27, 2021
- The University of Tokyo
- Masayuki Murata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device, analysis method, analysis program, cell manufactur...
- Patent number 10,746,647
- Issue date Aug 18, 2020
- The University of Tokyo
- Masayuki Murata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING DEVICE, ANALYSIS DEVICE, IMAGE PROCESSING METHOD,...
- Publication number 20240085405
- Publication date Mar 14, 2024
- Nikon Corporation
- Kenta IMAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM
- Publication number 20200065556
- Publication date Feb 27, 2020
- THE UNIVERSITY OF TOKYO
- Masayuki MURATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, ANALYSIS PROGRAM, CELL MANUFACTUR...
- Publication number 20170350805
- Publication date Dec 7, 2017
- THE UNIVERSITY OF TOKYO
- Masayuki MURATA
- G01 - MEASURING TESTING