Yoshiyuki Shichida

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device inspection apparatus
- Patent number 8,242,443
- Issue date Aug 14, 2012
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection apparatus
- Patent number 7,838,828
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS
- Publication number 20100314542
- Publication date Dec 16, 2010
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS
- Publication number 20080308725
- Publication date Dec 18, 2008
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING