Yoshiyuki Shioyama

Person

Yokkaichi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Simulation apparatus, simulation method and non-transitory computer...
- Patent number 9,183,673
- Issue date Nov 10, 2015
- Kabushiki Kaisha Toshiba
- Ai Omodaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect analyzing method and defect analyzing apparatus
- Patent number 8,965,551
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Yoshiyuki Shioyama
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing fail bit maps of waters and apparatus therefor
- Patent number 7,405,088
- Issue date Jul 29, 2008
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image pickup apparatus
- Patent number 7,224,003
- Issue date May 29, 2007
- Kabushiki Kaisha Toshiba
- Nobuo Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image pickup apparatus
- Patent number 7,042,061
- Issue date May 9, 2006
- Kabushiki Kaisha Toshiba
- Nobuo Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure detection system, failure detection method, and computer pr...
- Patent number 7,043,384
- Issue date May 9, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Grant
Solid-state image pickup apparatus
- Patent number 6,690,423
- Issue date Feb 10, 2004
- Kabushiki Kaisha Toshiba
- Nobuo Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state imaging device with four-phase charge-coupled device an...
- Patent number 6,335,220
- Issue date Jan 1, 2002
- Kabushiki Kaisha Toshiba
- Yoshiyuki Shioyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging device and method of manufacturing the same
- Patent number 6,028,629
- Issue date Feb 22, 2000
- Kabushiki Kaisha Toshiba
- Yoshiyuki Shioyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for conveying and processing a wafer in a physically cont...
- Patent number 5,747,780
- Issue date May 5, 1998
- Kabushiki Kaisha Toshiba
- Yoshiyuki Shioyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Four-phase driving CCD solid-state imaging device with a two-layer...
- Patent number 5,731,601
- Issue date Mar 24, 1998
- Kabushiki Kaisha Toshiba
- Yoshiyuki Shioyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state image sensor device with single-layered transfer electr...
- Patent number 5,637,894
- Issue date Jun 10, 1997
- Kabushiki Kaisha Toshiba
- Masako Hori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic RAM and method of manufacturing the same
- Patent number 5,559,350
- Issue date Sep 24, 1996
- Kabushiki Kaisha Toshiba
- Thoru Ozaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Solid-state image pickup apparatus
- Publication number 20060163684
- Publication date Jul 27, 2006
- Nobuo Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure detection system, failure detection method, and computer pr...
- Publication number 20050102591
- Publication date May 12, 2005
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing fail bit maps of wafers and apparatus therefor
- Publication number 20040255198
- Publication date Dec 16, 2004
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Solid-state image pickup apparatus
- Publication number 20040108502
- Publication date Jun 10, 2004
- Nobuo Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Yoshiyuki Shioyama

Person

Patents Grantslast 30 patents

Simulation apparatus, simulation method and non-transitory computer...

Defect analyzing method and defect analyzing apparatus

Method for analyzing fail bit maps of waters and apparatus therefor

Solid-state image pickup apparatus

Solid-state image pickup apparatus

Failure detection system, failure detection method, and computer pr...

Solid-state image pickup apparatus

Solid state imaging device with four-phase charge-coupled device an...

Solid-state imaging device and method of manufacturing the same

Apparatus for conveying and processing a wafer in a physically cont...

Four-phase driving CCD solid-state imaging device with a two-layer...

Solid state image sensor device with single-layered transfer electr...

Dynamic RAM and method of manufacturing the same

Patents Applicationslast 30 patents

Solid-state image pickup apparatus

Failure detection system, failure detection method, and computer pr...

Method for analyzing fail bit maps of wafers and apparatus therefor

Solid-state image pickup apparatus