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Yoshiyuki Takahara
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Tokyo, JP
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last 30 patents
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Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
Patent number
6,409,141
Issue date
Jun 25, 2002
Nihon Kohden Corporation
Masao Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
Patent number
6,157,500
Issue date
Dec 5, 2000
Nihon Kohden Corporation
Masao Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
Patent number
6,084,670
Issue date
Jul 4, 2000
Nihon Kohden Corporation
Masao Yamazaki
G01 - MEASURING TESTING