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Yoshiyuki YOKOYAMA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Positioning and fixing device
Patent number
10,732,220
Issue date
Aug 4, 2020
Tokyo Seimitsu Co., Ltd.
Hiroo Tamura
G01 - MEASURING TESTING
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Patent Grant
Prober and probe contact method
Patent number
7,405,584
Issue date
Jul 29, 2008
Tokyo Seimitsu Co., Ltd.
Taichi Fujita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POSITIONING AND FIXING DEVICE
Publication number
20170146595
Publication date
May 25, 2017
TOKYO SEIMITSU CO., LTD.
Hiroo TAMURA
G01 - MEASURING TESTING
Information
Patent Application
PROBER AND PROBE CONTACT METHOD
Publication number
20070268033
Publication date
Nov 22, 2007
Taichi Fujita
G01 - MEASURING TESTING