Yoshiyuki YOKOYAMA

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Positioning and fixing device

    • Patent number 10,732,220
    • Issue date Aug 4, 2020
    • Tokyo Seimitsu Co., Ltd.
    • Hiroo Tamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Prober and probe contact method

    • Patent number 7,405,584
    • Issue date Jul 29, 2008
    • Tokyo Seimitsu Co., Ltd.
    • Taichi Fujita
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    POSITIONING AND FIXING DEVICE

    • Publication number 20170146595
    • Publication date May 25, 2017
    • TOKYO SEIMITSU CO., LTD.
    • Hiroo TAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBER AND PROBE CONTACT METHOD

    • Publication number 20070268033
    • Publication date Nov 22, 2007
    • Taichi Fujita
    • G01 - MEASURING TESTING