Yosuke Itagaki

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring thickness of thin film
- Patent number 6,683,308
- Issue date Jan 27, 2004
- Fab Solutions, Inc.
- Yosuke Itagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring thickness of thin film
- Publication number 20030132381
- Publication date Jul 17, 2003
- NEC Electronics Corporation
- Yosuke Itagaki
- G01 - MEASURING TESTING