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Yosuke KAJII
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Ayabe-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Optical measurement device and optical measurement method
Patent number
11,194,047
Issue date
Dec 7, 2021
Omron Corporation
Yosuke Kajii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20220066033
Publication date
Mar 3, 2022
Omron Corporation
Yosuke KAJII
G01 - MEASURING TESTING
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Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20190219695
Publication date
Jul 18, 2019
Omron Corporation
Yosuke KAJII
G01 - MEASURING TESTING