Yosuke Kawamata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device employing fuse circuit and method for selectin...
- Patent number 7,656,220
- Issue date Feb 2, 2010
- Elpida Memory, Inc.
- Yosuke Kawamata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device including fuse detection circuit to det...
- Patent number 7,436,718
- Issue date Oct 14, 2008
- Elpida Memory, Inc.
- Hajime Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing apparatus and method
- Patent number 6,684,355
- Issue date Jan 27, 2004
- NEC Corporation
- Yosuke Kawamata
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME
- Publication number 20100013509
- Publication date Jan 21, 2010
- Elpida Memory, Inc.
- Shota SETOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Push switch
- Publication number 20090166163
- Publication date Jul 2, 2009
- CALSONIC KANSEI CORPORATION
- Hideo Moro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe card and measuring method for semiconductor wafers
- Publication number 20070241765
- Publication date Oct 18, 2007
- Elpida Memory, Inc.
- Yosuke Kawamata
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, METHOD OF DESIGNING THE PROBE CARD, AND METHOD OF TESTI...
- Publication number 20070216429
- Publication date Sep 20, 2007
- Elpida Memory, Inc.
- Yoshinori Fukushima
- G01 - MEASURING TESTING
Information Patent Application
Fuse detection method and semiconductor memory device including fus...
- Publication number 20060239101
- Publication date Oct 26, 2006
- ELPIDA MEMORY, INC.
- Hajime Tanaka
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device employing fuse circuit and method for selectin...
- Publication number 20060125549
- Publication date Jun 15, 2006
- ELPIDA MEMORY, INC.
- Yosuke Kawamata
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device employing fuse circuit and method for selectin...
- Publication number 20060125548
- Publication date Jun 15, 2006
- ELPIDA MEMORY, INC.
- Makoto Kitayama
- G11 - INFORMATION STORAGE
Information Patent Application
Memory testing apparatus and method
- Publication number 20010042231
- Publication date Nov 15, 2001
- NEC Corporation
- Yosuke Kawamata
- G11 - INFORMATION STORAGE

Yosuke Kawamata

Person

Patents Grantslast 30 patents

Semiconductor device employing fuse circuit and method for selectin...

Semiconductor memory device including fuse detection circuit to det...

Memory testing apparatus and method

Patents Applicationslast 30 patents

PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME

Push switch

Probe card and measuring method for semiconductor wafers

PROBE CARD, METHOD OF DESIGNING THE PROBE CARD, AND METHOD OF TESTI...

Fuse detection method and semiconductor memory device including fus...

Semiconductor device employing fuse circuit and method for selectin...

Semiconductor device employing fuse circuit and method for selectin...

Memory testing apparatus and method