Yosuke NAKANISHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for manufacturing same, for releave...
- Patent number 10,707,146
- Issue date Jul 7, 2020
- Mitsubishi Electric Corporation
- Motoru Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness measuring apparatus
- Patent number 10,677,585
- Issue date Jun 9, 2020
- Mitsubishi Electric Corporation
- Yuichi Masumoto
- G01 - MEASURING TESTING
Information Patent Grant
Power semiconductor device that includes a copper layer disposed on...
- Patent number 10,643,967
- Issue date May 5, 2020
- Mitsubishi Electric Corporation
- Hiroaki Okabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing silicon carbide semiconductor device and s...
- Patent number 9,842,738
- Issue date Dec 12, 2017
- Mitsubishi Electric Corporation
- Yosuke Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method and semiconductor device
- Patent number 9,716,006
- Issue date Jul 25, 2017
- Mitsubishi Electric Corporation
- Kenji Hamada
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR APPARATUS, SEMICONDUCTOR M...
- Publication number 20240312805
- Publication date Sep 19, 2024
- Mitsubishi Electric Corporation
- Kyohei AKIYOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANU...
- Publication number 20230036107
- Publication date Feb 2, 2023
- Mitsubishi Electric Corporation
- Kyohei AKIYOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD F...
- Publication number 20220149173
- Publication date May 12, 2022
- Mitsubishi Electric Corporation
- Tomoaki NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM THICKNESS MEASURING APPARATUS
- Publication number 20190310074
- Publication date Oct 10, 2019
- Mitsubishi Electric Corporation
- Yuichi MASUMOTO
- G01 - MEASURING TESTING
Information Patent Application
POWER SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20190172812
- Publication date Jun 6, 2019
- MITSUBISHI ELECTRIC CORPORATION
- Hiroaki OKABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20190122955
- Publication date Apr 25, 2019
- MITSUBISHI ELECTRIC CORPORATION
- Motoru YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
- Publication number 20170140934
- Publication date May 18, 2017
- MITSUBISHI ELECTRIC CORPORATION
- Kenji HAMADA
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND S...
- Publication number 20170032968
- Publication date Feb 2, 2017
- Mitsubishi Electric Corporation
- Yosuke NAKANISHI
- H01 - BASIC ELECTRIC ELEMENTS

Yosuke NAKANISHI

Person

Patents Grantslast 30 patents

Semiconductor device and method for manufacturing same, for releave...

Film thickness measuring apparatus

Power semiconductor device that includes a copper layer disposed on...

Method for manufacturing silicon carbide semiconductor device and s...

Semiconductor device manufacturing method and semiconductor device

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING A SEMICONDUCTOR APPARATUS, SEMICONDUCTOR M...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANU...

SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD F...

FILM THICKNESS MEASURING APPARATUS

POWER SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND S...