Yosuke Ogawa

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Yokohama Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Impedance measuring circuit
- Patent number 9,817,035
- Issue date Nov 14, 2017
- Kabushiki Kaisha Toshiba
- Yosuke Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 9,484,870
- Issue date Nov 1, 2016
- Kabushiki Kaisha Toshiba
- Shinji Nakatsuka
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
IMPEDANCE MEASURING CIRCUIT
- Publication number 20170097377
- Publication date Apr 6, 2017
- Kabushiki Kaisha Toshiba
- Yosuke Ogawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20160276989
- Publication date Sep 22, 2016
- Kabushiki Kaisha Toshiba
- Shinji Nakatsuka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BIAS CIRCUIT, OPERATIONAL AMPLIFIER, AND DELTA SIGMA TYPE AD CONVERTER
- Publication number 20160079924
- Publication date Mar 17, 2016
- Kabushiki Kaisha Toshiba
- Yosuke Ogawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTERFACE CIRCUIT
- Publication number 20150061734
- Publication date Mar 5, 2015
- Kabushiki Kaisha Toshiba
- Yosuke Ogawa
- H03 - BASIC ELECTRONIC CIRCUITRY