Yosuke OKAMOTO

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Position measuring method, position measuring apparatus, and semico...
- Patent number 10,599,056
- Issue date Mar 24, 2020
- TOSHIBA MEMORY CORPORATION
- Miki Toshima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imprint device and pattern forming method
- Patent number 9,952,505
- Issue date Apr 24, 2018
- TOSHIBA MEMORY CORPORATION
- Yosuke Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern accuracy detecting apparatus and processing system
- Patent number 9,941,177
- Issue date Apr 10, 2018
- TOSHIBA MEMORY CORPORATION
- Kentaro Kasa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Positional deviation measuring device, non-transitory computer-read...
- Patent number 9,784,573
- Issue date Oct 10, 2017
- TOSHIBA MEMORY CORPORATION
- Hidenori Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring pattern misalignment
- Patent number 9,244,365
- Issue date Jan 26, 2016
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
EUV mask
- Patent number 9,146,458
- Issue date Sep 29, 2015
- Kabushiki Kaisha Toshiba
- Yoshinori Hagio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement mark, method for measurement, and measurement apparatus
- Patent number 8,976,356
- Issue date Mar 10, 2015
- Kabushiki Kaisha Toshiba
- Nobuhiro Komine
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus, exposure method, and method of manufacturing se...
- Patent number 8,953,163
- Issue date Feb 10, 2015
- Kabushiki Kaisha Toshiba
- Kentaro Kasa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dose-data generating apparatus
- Patent number 8,914,766
- Issue date Dec 16, 2014
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern forming method, positional deviation measuring method and p...
- Patent number 8,859,167
- Issue date Oct 14, 2014
- Kabushiki Kaisha Toshiba
- Yoshinori Hagio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for making correction map of dose amount, exposure method, a...
- Patent number 8,832,607
- Issue date Sep 9, 2014
- Kabushiki Kaisha Toshiba
- Takashi Koike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask and method for fabricating semiconductor device
- Patent number 8,790,851
- Issue date Jul 29, 2014
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Photomask and method for manufacturing the same
- Patent number 8,778,570
- Issue date Jul 15, 2014
- Kabushiki Kaisha Toshiba
- Kentaro Okuda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dose-data generating apparatus, dose-data generating method, and ma...
- Patent number 8,504,951
- Issue date Aug 6, 2013
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unevenness inspection method, method for manufacturing display pane...
- Patent number 8,320,658
- Issue date Nov 27, 2012
- Kabushiki Kaisha Toshiba
- Hiroyuki Tanizaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray CT apparatus and image processing apparatus
- Patent number 7,953,263
- Issue date May 31, 2011
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for estimating scattered ray intensity in X-ray CT and X-ray...
- Patent number 7,609,803
- Issue date Oct 27, 2009
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
PATTERN-EDGE DETECTION METHOD, PATTERN-EDGE DETECTION APPARATUS, AN...
- Publication number 20230005157
- Publication date Jan 5, 2023
- TASMIT, INC.
- Yosuke OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION MEASURING METHOD, POSITION MEASURING APPARATUS, AND SEMICO...
- Publication number 20200081357
- Publication date Mar 12, 2020
- Toshiba Memory Corporation
- Miki Toshima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN ACCURACY DETECTING APPARATUS AND PROCESSING SYSTEM
- Publication number 20170271214
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Kentaro KASA
- G01 - MEASURING TESTING
Information Patent Application
POSITIONAL DEVIATION MEASURING DEVICE, NON-TRANSITORY COMPUTER-READ...
- Publication number 20160245645
- Publication date Aug 25, 2016
- KABUSHIKI KAISHA TOSHIBA
- Hidenori SATO
- G01 - MEASURING TESTING
Information Patent Application
IMPRINT DEVICE AND PATTERN FORMING METHOD
- Publication number 20150251350
- Publication date Sep 10, 2015
- KABUSHIKI KAISHA TOSHIBA
- Yosuke OKAMOTO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
MASK DISTORTION MEASURING APPARATUS AND METHOD OF MEASURING MASK DI...
- Publication number 20150009488
- Publication date Jan 8, 2015
- KABUSHIKI KAISHA TOSHIBA
- Yosuke OKAMOTO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXPOSURE METHOD, REFLECTION TYPE MASK, AND SEMICONDUCTOR DEVICE MAN...
- Publication number 20140349219
- Publication date Nov 27, 2014
- KABUSHIKI KAISHA TOSHIBA
- Hiroyuki MIZUNO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXPOSURE SYSTEM AND EXPOSURE METHOD
- Publication number 20140285787
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Eiji YONEDA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MEASURING PATTERN MISALIGNMENT
- Publication number 20140285652
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Yosuke OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC CHUCK, RETICLE, AND ELECTROSTATIC CHUCK METHOD
- Publication number 20140240892
- Publication date Aug 28, 2014
- KABUSHIKI KAISHA TOSHIBA
- Yosuke OKAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT MARK, METHOD FOR MEASUREMENT, AND MEASUREMENT APPARATUS
- Publication number 20140240704
- Publication date Aug 28, 2014
- Nobuhiro KOMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EUV EXPOSURE APPARATUS, EUV MASK, AND METHOD OF MEASURING DISTORTION
- Publication number 20140192335
- Publication date Jul 10, 2014
- Kabushiki Kaisha Toshiba
- Yoshinori HAGIO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN FORMING METHOD, POSITIONAL DEVIATION MEASURING METHOD AND P...
- Publication number 20140065522
- Publication date Mar 6, 2014
- Yoshinori HAGIO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXPOSURE APPARATUS, EXPOSURE METHOD, AND METHOD OF MANUFACTURING SE...
- Publication number 20140065528
- Publication date Mar 6, 2014
- Kabushiki Kaisha Toshiba
- Kentaro KASA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERNING METHOD AND TEMPLATE
- Publication number 20140061969
- Publication date Mar 6, 2014
- Yosuke OKAMOTO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
DOSE-DATA GENERATING APPARATUS
- Publication number 20130298087
- Publication date Nov 7, 2013
- Kabushiki Kaisha Toshiba
- Yosuke Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MAKING CORRECTION MAP OF DOSE AMOUNT, EXPOSURE METHOD, A...
- Publication number 20130252176
- Publication date Sep 26, 2013
- Kabushiki Kaisha Toshiba
- Takashi KOIKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20130252429
- Publication date Sep 26, 2013
- KABUSHIKI KAISHA TOSHIBA
- Yosuke OKAMOTO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OVERLAY MEASURING METHOD
- Publication number 20130148120
- Publication date Jun 13, 2013
- Kabushiki Kaisha Toshiba
- Yosuke OKAMOTO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHOTOMASK AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20120225374
- Publication date Sep 6, 2012
- Kabushiki Kaisha Toshiba
- Kentaro OKUDA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DOSE-DATA GENERATING APPARATUS, DOSE-DATA GENERATING METHOD, AND MA...
- Publication number 20120066653
- Publication date Mar 15, 2012
- Yosuke OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ESTIMATING SCATTERED RAY INTENSITY IN X-RAY CT AND X-RAY...
- Publication number 20090092222
- Publication date Apr 9, 2009
- Kabushiki Kaisha Toshiba
- Yosuke OKAMOTO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
UNEVENNESS INSPECTION METHOD, METHOD FOR MANUFACTURING DISPLAY PANE...
- Publication number 20080063254
- Publication date Mar 13, 2008
- Kabushiki Kaisha Toshiba
- Hiroyuki Tanizaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY CT APPARATUS AND IMAGE PROCESSING APPARATUS
- Publication number 20070230653
- Publication date Oct 4, 2007
- Yosuke OKAMOTO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Yosuke OKAMOTO

Person

Patents Grantslast 30 patents

Position measuring method, position measuring apparatus, and semico...

Imprint device and pattern forming method

Pattern accuracy detecting apparatus and processing system

Positional deviation measuring device, non-transitory computer-read...

Method for measuring pattern misalignment

EUV mask

Measurement mark, method for measurement, and measurement apparatus

Exposure apparatus, exposure method, and method of manufacturing se...

Dose-data generating apparatus

Pattern forming method, positional deviation measuring method and p...

Method for making correction map of dose amount, exposure method, a...

Mask and method for fabricating semiconductor device

Photomask and method for manufacturing the same

Dose-data generating apparatus, dose-data generating method, and ma...

Unevenness inspection method, method for manufacturing display pane...

X-ray CT apparatus and image processing apparatus

Method for estimating scattered ray intensity in X-ray CT and X-ray...

Patents Applicationslast 30 patents

PATTERN-EDGE DETECTION METHOD, PATTERN-EDGE DETECTION APPARATUS, AN...

POSITION MEASURING METHOD, POSITION MEASURING APPARATUS, AND SEMICO...

PATTERN ACCURACY DETECTING APPARATUS AND PROCESSING SYSTEM

POSITIONAL DEVIATION MEASURING DEVICE, NON-TRANSITORY COMPUTER-READ...

IMPRINT DEVICE AND PATTERN FORMING METHOD

MASK DISTORTION MEASURING APPARATUS AND METHOD OF MEASURING MASK DI...

EXPOSURE METHOD, REFLECTION TYPE MASK, AND SEMICONDUCTOR DEVICE MAN...

EXPOSURE SYSTEM AND EXPOSURE METHOD

METHOD FOR MEASURING PATTERN MISALIGNMENT

ELECTROSTATIC CHUCK, RETICLE, AND ELECTROSTATIC CHUCK METHOD

MEASUREMENT MARK, METHOD FOR MEASUREMENT, AND MEASUREMENT APPARATUS

EUV EXPOSURE APPARATUS, EUV MASK, AND METHOD OF MEASURING DISTORTION

PATTERN FORMING METHOD, POSITIONAL DEVIATION MEASURING METHOD AND P...

EXPOSURE APPARATUS, EXPOSURE METHOD, AND METHOD OF MANUFACTURING SE...

PATTERNING METHOD AND TEMPLATE

DOSE-DATA GENERATING APPARATUS

METHOD FOR MAKING CORRECTION MAP OF DOSE AMOUNT, EXPOSURE METHOD, A...

MASK AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

OVERLAY MEASURING METHOD

PHOTOMASK AND METHOD FOR MANUFACTURING THE SAME

DOSE-DATA GENERATING APPARATUS, DOSE-DATA GENERATING METHOD, AND MA...

METHOD FOR ESTIMATING SCATTERED RAY INTENSITY IN X-RAY CT AND X-RAY...

UNEVENNESS INSPECTION METHOD, METHOD FOR MANUFACTURING DISPLAY PANE...

X-RAY CT APPARATUS AND IMAGE PROCESSING APPARATUS