Yosuke YOSHIZAWA

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing an electrical test probe
- Patent number 7,736,690
- Issue date Jun 15, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe
- Patent number 7,721,429
- Issue date May 25, 2010
- Kabushiki Kaisha Nihon Micronics
- Akira Soma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING A PROBE
- Publication number 20080184559
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Akira SOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080186038
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING