Yotam SOFER

Person

Givataim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Selecting a representative subset of potential defects to improve d...
- Patent number 11,940,390
- Issue date Mar 26, 2024
- Applied Materials Israel Ltd.
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting a coreset of potential defects for estimating expected de...
- Patent number 11,360,030
- Issue date Jun 14, 2022
- Applied Materials Isreal Ltd
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided inspection of a semiconductor wafer based on spatial density...
- Patent number 11,060,981
- Issue date Jul 13, 2021
- Applied Materials Israel Ltd.
- Ariel Hirszhorn
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining defects in a semiconductor specimen and system...
- Patent number 10,937,706
- Issue date Mar 2, 2021
- Applied Materials Israel Ltd.
- Yotam Sofer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process window analysis
- Patent number 10,720,367
- Issue date Jul 21, 2020
- Applied Materials Israel Ltd.
- Idan Kaizerman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Guided inspection of a semiconductor wafer based on systematic defects
- Patent number 10,605,745
- Issue date Mar 31, 2020
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining defects in a semiconductor specimen and system...
- Patent number 10,504,805
- Issue date Dec 10, 2019
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Grant
Process window analysis
- Patent number 10,312,161
- Issue date Jun 4, 2019
- Applied Materials Israel Ltd.
- Idan Kaizerman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adaptive sampling in examining an object and system thereof
- Patent number 10,190,991
- Issue date Jan 29, 2019
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20220291138
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20210239623
- Publication date Aug 5, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTEM...
- Publication number 20200075434
- Publication date Mar 5, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS
- Publication number 20200003700
- Publication date Jan 2, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Application
PROCESS WINDOW ANALYSIS
- Publication number 20190355628
- Publication date Nov 21, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Idan KAIZERMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SPATIAL DENSITY...
- Publication number 20190293569
- Publication date Sep 26, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ariel HIRSZHORN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTEM...
- Publication number 20190067134
- Publication date Feb 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADAPTIVE SAMPLING IN EXAMINING AN OBJECT AND SYSTEM THEREOF
- Publication number 20180306728
- Publication date Oct 25, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
PROCESS WINDOW ANALYSIS
- Publication number 20160284579
- Publication date Sep 29, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Idan KAIZERMAN
- H01 - BASIC ELECTRIC ELEMENTS

Yotam SOFER

Person

Patents Grantslast 30 patents

Selecting a representative subset of potential defects to improve d...

Selecting a coreset of potential defects for estimating expected de...

Guided inspection of a semiconductor wafer based on spatial density...

Method of examining defects in a semiconductor specimen and system...

Process window analysis

Guided inspection of a semiconductor wafer based on systematic defects

Method of examining defects in a semiconductor specimen and system...

Process window analysis

Method for adaptive sampling in examining an object and system thereof

Patents Applicationslast 30 patents

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

METHOD OF EXAMINING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTEM...

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS

PROCESS WINDOW ANALYSIS

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SPATIAL DENSITY...

METHOD OF EXAMINING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTEM...

METHOD FOR ADAPTIVE SAMPLING IN EXAMINING AN OBJECT AND SYSTEM THEREOF

PROCESS WINDOW ANALYSIS