TREA

Yotaro Mori

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  • Shiga-ken, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device and semiconductor device testing method
    • Patent number 6,539,324
    • Issue date Mar 25, 2003
    • International Business Machines Corporation
    • Hisatada Miyatake
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Sense-amplifying circuit
    • Patent number 6,483,350
    • Issue date Nov 19, 2002
    • International Business Machines Corporation
    • Hisatada Miyatake
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Sense-amplifying circuit
    • Patent number 6,426,657
    • Issue date Jul 30, 2002
    • International Business Machines Corporation
    • Hisatada Miyatake
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    High speed CAM cell
    • Patent number 6,181,591
    • Issue date Jan 30, 2001
    • International Business Machines Corporation
    • Hisatada Miyatake
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Processor based BIST for an embedded memory
    • Patent number 5,961,653
    • Issue date Oct 5, 1999
    • International Business Machines Corporation
    • Howard Leo Kalter
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents