YOU-JIN WANG

Person

MILPITAS, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Load lock system for charged particle beam imaging
- Patent number 10,176,967
- Issue date Jan 8, 2019
- Hermes-Microvision, Inc.
- Hsuan-Bin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 10,054,556
- Issue date Aug 21, 2018
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 9,572,237
- Issue date Feb 14, 2017
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discharging method for charged particle beam imaging
- Patent number 9,460,887
- Issue date Oct 4, 2016
- Hermes Microvision, Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 9,113,538
- Issue date Aug 18, 2015
- Hermes-Microvision, Inc.
- You-Jin Wang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for inspecting EUV reticle and apparatus thereof
- Patent number 8,692,193
- Issue date Apr 8, 2014
- Hermes-Microvision, Inc.
- Chiyan Kuan
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling particle absorption on a wafer sample being i...
- Patent number 8,604,428
- Issue date Dec 10, 2013
- Hermes-Microvision, Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for discharging extreme ultraviolet mask
- Patent number 8,575,573
- Issue date Nov 5, 2013
- Hermes-Microvision, Inc.
- You-Jin Wang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for venting gas into closed space and gas supply assembly th...
- Patent number 8,302,420
- Issue date Nov 6, 2012
- Hermes-Microvision, Inc.
- You-Jin Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for inspecting EUV reticle and apparatus thereof
- Patent number 8,217,349
- Issue date Jul 10, 2012
- Hermes-Microvision, Inc.
- Chiyan Kuan
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling particle absorption on a wafer sample being i...
- Patent number 8,110,818
- Issue date Feb 7, 2012
- Hermes-Microvision, Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting a sample
- Patent number 8,089,637
- Issue date Jan 3, 2012
- Hermes-Microvision, Inc.
- You-Jin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Z-stage configuration and application thereof
- Patent number 8,031,344
- Issue date Oct 4, 2011
- Hermes-Microvision, Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and handling apparatus for placing patterning device on supp...
- Patent number 7,868,303
- Issue date Jan 11, 2011
- Hermes-Microvision, Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterning device holding apparatus and application thereof
- Patent number 7,838,848
- Issue date Nov 23, 2010
- Hermes-Microvision, Inc.
- Hsuan-Bin Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20180240645
- Publication date Aug 23, 2018
- HERMES MICROVISION INC.
- HSUAN-BIN HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...
- Publication number 20170053774
- Publication date Feb 23, 2017
- HERMES MICROVISION INC.
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...
- Publication number 20150305131
- Publication date Oct 22, 2015
- HERMES MICROVISION INC.
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK
- Publication number 20140027634
- Publication date Jan 30, 2014
- HERMES MICROVISION, INC.
- You-Jin WANG
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK
- Publication number 20120292509
- Publication date Nov 22, 2012
- You-Jin WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING EUV RETICLE AND APPARATUS THEREOF
- Publication number 20120228494
- Publication date Sep 13, 2012
- Hermes-Microvision, Inc.
- CHIYAN KUAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING EUV RETICLE AND APPARATUS THEREOF
- Publication number 20120032076
- Publication date Feb 9, 2012
- Hermes-Microvision, Inc.
- CHIYAN KUAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTROLLING PARTICLE ABSORPTION ON A WAFER SAMPLE BEING I...
- Publication number 20120006984
- Publication date Jan 12, 2012
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-STAGE CONFIGURATION AND APPLICATION THEREOF
- Publication number 20110101222
- Publication date May 5, 2011
- Hermes-Microvision, Inc.
- YOU-JIN WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHAGING METHOD FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20100288923
- Publication date Nov 18, 2010
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR VENTING GAS INTO CLOSED SPACE AND GAS SUPPLY ASSEMBLY TH...
- Publication number 20100270467
- Publication date Oct 28, 2010
- Hermes-Microvision, Inc.
- YOU-JIN WANG
- G05 - CONTROLLING REGULATING
Information Patent Application
APPARATUS FOR DETECTING A SAMPLE
- Publication number 20100165346
- Publication date Jul 1, 2010
- Hermes-Microvision, Inc.
- YOU-JIN WANG
- G01 - MEASURING TESTING
Information Patent Application
PATTERNING DEVICE HOLDING APPARATUS AND APPLICATION THEREOF
- Publication number 20100102226
- Publication date Apr 29, 2010
- HERMES MICROVISION, INC.
- Hsuan-Bin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND HANDLING APPARATUS FOR PLACING PATTERNING DEVICE ON SUP...
- Publication number 20100090107
- Publication date Apr 15, 2010
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CONTROLLING PARTICLE ABSORPTION ON A WAFER SAMPLE BEING I...
- Publication number 20100084554
- Publication date Apr 8, 2010
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS

YOU-JIN WANG

Person

Patents Grantslast 30 patents

Load lock system for charged particle beam imaging

Structure electron beam inspection system for inspecting extreme ul...

Structure electron beam inspection system for inspecting extreme ul...

Discharging method for charged particle beam imaging

Structure electron beam inspection system for inspecting extreme ul...

Method for inspecting EUV reticle and apparatus thereof

Method of controlling particle absorption on a wafer sample being i...

Structure for discharging extreme ultraviolet mask

Method for venting gas into closed space and gas supply assembly th...

Method for inspecting EUV reticle and apparatus thereof

Method of controlling particle absorption on a wafer sample being i...

Apparatus for detecting a sample

Z-stage configuration and application thereof

Method and handling apparatus for placing patterning device on supp...

Patterning device holding apparatus and application thereof

Patents Applicationslast 30 patents

LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING

STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...

STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...

STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK

STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK

METHOD FOR INSPECTING EUV RETICLE AND APPARATUS THEREOF

METHOD FOR INSPECTING EUV RETICLE AND APPARATUS THEREOF

METHOD OF CONTROLLING PARTICLE ABSORPTION ON A WAFER SAMPLE BEING I...

Z-STAGE CONFIGURATION AND APPLICATION THEREOF

DISCHAGING METHOD FOR CHARGED PARTICLE BEAM IMAGING

METHOD FOR VENTING GAS INTO CLOSED SPACE AND GAS SUPPLY ASSEMBLY TH...

APPARATUS FOR DETECTING A SAMPLE

PATTERNING DEVICE HOLDING APPARATUS AND APPLICATION THEREOF

METHOD AND HANDLING APPARATUS FOR PLACING PATTERNING DEVICE ON SUP...

METHOD OF CONTROLLING PARTICLE ABSORPTION ON A WAFER SAMPLE BEING I...