You-Keun Han

Person

Gyeonggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Address transforming circuit and semiconductor memory device includ...
- Patent number 9,128,817
- Issue date Sep 8, 2015
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module and memory system comprising same
- Patent number 9,099,166
- Issue date Aug 4, 2015
- Samsung Electronics Co., Ltd.
- Jun Hee Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor devices including design for test capabilities and se...
- Patent number 8,742,780
- Issue date Jun 3, 2014
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- G01 - MEASURING TESTING
Information Patent Grant
Memory module including memory buffer and memory system having the...
- Patent number 8,576,637
- Issue date Nov 5, 2013
- Samsung Electronics Co., Ltd.
- Soon-Deok Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module and memory system comprising memory module
- Patent number 8,547,761
- Issue date Oct 1, 2013
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Memory module cutting off DM pad leakage current
- Patent number 8,462,534
- Issue date Jun 11, 2013
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module cutting off DM pad leakage current
- Patent number 8,159,853
- Issue date Apr 17, 2012
- Samsung Electronis Co., Ltd.
- Seok-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing a memory module and hub of the memory module
- Patent number 8,051,343
- Issue date Nov 1, 2011
- Samsung Electronics Co., Ltd.
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory modules and memory systems having the same
- Patent number 7,965,530
- Issue date Jun 21, 2011
- Samsung Electronics Co., Ltd.
- You-Keun Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing a memory module and hub of the memory module
- Patent number 7,849,373
- Issue date Dec 7, 2010
- Samsung Electronics Co., Ltd.
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module packaging test system
- Patent number 7,814,379
- Issue date Oct 12, 2010
- Samsung Electronics Co., Ltd.
- Jung-kuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module, memory unit, and hub with non-periodic clock and met...
- Patent number 7,606,110
- Issue date Oct 20, 2009
- Samsung Electronics Co., Ltd.
- You-Keun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for interfacing between test system and memory
- Patent number 7,519,873
- Issue date Apr 14, 2009
- Samsung Electronics Co., Ltd.
- Seung-Man Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory module testing apparatus and method of testing memory modules
- Patent number 7,487,413
- Issue date Feb 3, 2009
- Samsung Electronics Co., Ltd.
- Jung-kuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing a memory module and hub of the memory module
- Patent number 7,447,954
- Issue date Nov 4, 2008
- Samsung Electronics Co., Ltd.
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory module and semiconductor memory device
- Patent number 7,426,149
- Issue date Sep 16, 2008
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY MODULE AND MEMORY SYSTEM COMPRISING SAME
- Publication number 20140219044
- Publication date Aug 7, 2014
- Samsung Electronics Co., Ltd.
- JUN HEE SHIN
- G11 - INFORMATION STORAGE
Information Patent Application
ADDRESS TRANSFORMING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUD...
- Publication number 20120239903
- Publication date Sep 20, 2012
- Samsung Electronics Co., Ltd.
- Seok-Il Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY MODULE CUTTING OFF DM PAD LEAKAGE CURRENT
- Publication number 20120182777
- Publication date Jul 19, 2012
- Samsung Electronics Co., Ltd.
- Seok-Il KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE INCLUDING MEMORY BUFFER AND MEMORY SYSTEM HAVING THE...
- Publication number 20110176371
- Publication date Jul 21, 2011
- Soon-Deok Jang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE AND MEMORY SYSTEM COMPRISING MEMORY MODULE
- Publication number 20110161576
- Publication date Jun 30, 2011
- Samsung Electronics Co., Ltd.
- Seok-Il KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Devices Including Design for Test Capabilities and Se...
- Publication number 20110115509
- Publication date May 19, 2011
- SAMSUNG ELECTRONICS CO., LTD.
- Seok-Il Kim
- G01 - MEASURING TESTING
Information Patent Application
Method of testing a memory module and hub of the memory module
- Publication number 20110113296
- Publication date May 12, 2011
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE CUTTING OFF DM PAD LEAKAGE CURRENT
- Publication number 20100202180
- Publication date Aug 12, 2010
- Samsung Electronics Co., Ltd.
- Seok-Il KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULES AND MEMORY SYSTEMS HAVING THE SAME
- Publication number 20090103374
- Publication date Apr 23, 2009
- Samsung Electronics Co., Ltd.
- You-Keun HAN
- G11 - INFORMATION STORAGE
Information Patent Application
Method of testing a memory module and hub of the memory module
- Publication number 20090044062
- Publication date Feb 12, 2009
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module packaging test system
- Publication number 20080016400
- Publication date Jan 17, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Jung-kuk Lee
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory module and semiconductor memory device
- Publication number 20070171740
- Publication date Jul 26, 2007
- Seok-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Methods and apparatus for interfacing between test system and memory
- Publication number 20070022335
- Publication date Jan 25, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Seung-Man Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory module testing apparatus and related method
- Publication number 20060230249
- Publication date Oct 12, 2006
- Jung-kuk Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module with memory devices of different capacity
- Publication number 20060059298
- Publication date Mar 16, 2006
- Jeong-Hyeon Cho
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module, memory unit, and hub with non-periodic clock and met...
- Publication number 20060044927
- Publication date Mar 2, 2006
- You-Keun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of testing a memory module and hub of the memory module
- Publication number 20060006419
- Publication date Jan 12, 2006
- Seung-Man Shin
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for interfacing between test system and embedd...
- Publication number 20050289287
- Publication date Dec 29, 2005
- Seung-Man Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-layer circuit board with thermal diffusion and method of fabr...
- Publication number 20050183882
- Publication date Aug 25, 2005
- Young Yun
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

You-Keun Han

Person

Patents Grantslast 30 patents

Address transforming circuit and semiconductor memory device includ...

Memory module and memory system comprising same

Semiconductor devices including design for test capabilities and se...

Memory module including memory buffer and memory system having the...

Memory module and memory system comprising memory module

Memory module cutting off DM pad leakage current

Memory module cutting off DM pad leakage current

Method of testing a memory module and hub of the memory module

Memory modules and memory systems having the same

Method of testing a memory module and hub of the memory module

Memory module packaging test system

Memory module, memory unit, and hub with non-periodic clock and met...

Methods and apparatus for interfacing between test system and memory

Memory module testing apparatus and method of testing memory modules

Method of testing a memory module and hub of the memory module

Semiconductor memory module and semiconductor memory device

Patents Applicationslast 30 patents

MEMORY MODULE AND MEMORY SYSTEM COMPRISING SAME

ADDRESS TRANSFORMING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUD...

MEMORY MODULE CUTTING OFF DM PAD LEAKAGE CURRENT

MEMORY MODULE INCLUDING MEMORY BUFFER AND MEMORY SYSTEM HAVING THE...

MEMORY MODULE AND MEMORY SYSTEM COMPRISING MEMORY MODULE

Semiconductor Devices Including Design for Test Capabilities and Se...

Method of testing a memory module and hub of the memory module

MEMORY MODULE CUTTING OFF DM PAD LEAKAGE CURRENT

MEMORY MODULES AND MEMORY SYSTEMS HAVING THE SAME

Method of testing a memory module and hub of the memory module

Memory module packaging test system

Semiconductor memory module and semiconductor memory device

Methods and apparatus for interfacing between test system and memory

Memory module testing apparatus and related method

Memory module with memory devices of different capacity

Memory module, memory unit, and hub with non-periodic clock and met...

Method of testing a memory module and hub of the memory module

Method and apparatus for interfacing between test system and embedd...

Multi-layer circuit board with thermal diffusion and method of fabr...