Membership
Tour
Register
Log in
Youfei JIANG
Follow
Person
Milpitas, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System and method for scanning a sample using multi-beam inspection...
Patent number
12,165,837
Issue date
Dec 10, 2024
ASML Netherlands B.V.
Martinus Gerardus Maria Johannes Maassen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system of image-forming multi-electron beams
Patent number
12,165,831
Issue date
Dec 10, 2024
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tilt-column multi-beam electron microscopy system and method
Patent number
12,068,129
Issue date
Aug 20, 2024
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bandpass charged particle energy filtering detector for charged par...
Patent number
11,749,495
Issue date
Sep 5, 2023
KLA Corp.
Youfei Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample pre-charging methods and apparatuses for charged particle be...
Patent number
11,676,792
Issue date
Jun 13, 2023
ASML Netherlands, B.V.
Xuedong Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for scanning a sample using multi-beam inspection...
Patent number
11,469,076
Issue date
Oct 11, 2022
ASML Netherlands B.V.
Martinus Gerardus Maria Johannes Massen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-lens wafer pre-charging and inspection with multiple beams
Patent number
11,152,191
Issue date
Oct 19, 2021
ASML Netherlands B.V.
Weihua Yin
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECT...
Publication number
20240194440
Publication date
Jun 13, 2024
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
Publication number
20240153737
Publication date
May 9, 2024
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS
Publication number
20240096586
Publication date
Mar 21, 2024
KLA Corporation
Xinrong JIANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Creating Multiple Electron Beams with a Photocathode Film
Publication number
20230395349
Publication date
Dec 7, 2023
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
Publication number
20230360877
Publication date
Nov 9, 2023
ASML NETHERLANDS B.V.
Xuedong LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...
Publication number
20230274906
Publication date
Aug 31, 2023
ASML NETHERLANDS B.V.
Martinus Gerardus, Maria, Johannes MAASSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE...
Publication number
20230245933
Publication date
Aug 3, 2023
KLA Corporation
Youfei JIANG
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
BANDPASS CHARGED PARTICLE ENERGY FILTERING DETECTOR FOR CHARGED PAR...
Publication number
20230104558
Publication date
Apr 6, 2023
KLA Corporation
Youfei Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON SOURCE WITH MAGNETIC SUPPRESSOR ELECTRODE
Publication number
20220108862
Publication date
Apr 7, 2022
KLA Corporation
Nikolai Chubun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-LENS WAFER PE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS
Publication number
20220102111
Publication date
Mar 31, 2022
ASML NETHERLANDS B.V.
Weihua YIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...
Publication number
20210217582
Publication date
Jul 15, 2021
ASML NETHERLANDS B.V.
Martinus Gerardus, Maria, Johannes MAASSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
Publication number
20200266023
Publication date
Aug 20, 2020
ASML NETHERLANDS B.V.
Xuedong LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-LENS WAFER PRE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS
Publication number
20200211818
Publication date
Jul 2, 2020
ASML NETHERLANDS B.V.
Weihua YIN
H01 - BASIC ELECTRIC ELEMENTS