Youfei JIANG

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sample pre-charging methods and apparatuses for charged particle be...
- Patent number 12,191,109
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning a sample using multi-beam inspection...
- Patent number 12,165,837
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of image-forming multi-electron beams
- Patent number 12,165,831
- Issue date Dec 10, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tilt-column multi-beam electron microscopy system and method
- Patent number 12,068,129
- Issue date Aug 20, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bandpass charged particle energy filtering detector for charged par...
- Patent number 11,749,495
- Issue date Sep 5, 2023
- KLA Corp.
- Youfei Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample pre-charging methods and apparatuses for charged particle be...
- Patent number 11,676,792
- Issue date Jun 13, 2023
- ASML Netherlands, B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning a sample using multi-beam inspection...
- Patent number 11,469,076
- Issue date Oct 11, 2022
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Massen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-lens wafer pre-charging and inspection with multiple beams
- Patent number 11,152,191
- Issue date Oct 19, 2021
- ASML Netherlands B.V.
- Weihua Yin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECT...
- Publication number 20240194440
- Publication date Jun 13, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
- Publication number 20240153737
- Publication date May 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS
- Publication number 20240096586
- Publication date Mar 21, 2024
- KLA Corporation
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Creating Multiple Electron Beams with a Photocathode Film
- Publication number 20230395349
- Publication date Dec 7, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
- Publication number 20230360877
- Publication date Nov 9, 2023
- ASML NETHERLANDS B.V.
- Xuedong LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...
- Publication number 20230274906
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Martinus Gerardus, Maria, Johannes MAASSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE...
- Publication number 20230245933
- Publication date Aug 3, 2023
- KLA Corporation
- Youfei JIANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
BANDPASS CHARGED PARTICLE ENERGY FILTERING DETECTOR FOR CHARGED PAR...
- Publication number 20230104558
- Publication date Apr 6, 2023
- KLA Corporation
- Youfei Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE WITH MAGNETIC SUPPRESSOR ELECTRODE
- Publication number 20220108862
- Publication date Apr 7, 2022
- KLA Corporation
- Nikolai Chubun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LENS WAFER PE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS
- Publication number 20220102111
- Publication date Mar 31, 2022
- ASML NETHERLANDS B.V.
- Weihua YIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...
- Publication number 20210217582
- Publication date Jul 15, 2021
- ASML NETHERLANDS B.V.
- Martinus Gerardus, Maria, Johannes MAASSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
- Publication number 20200266023
- Publication date Aug 20, 2020
- ASML NETHERLANDS B.V.
- Xuedong LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LENS WAFER PRE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS
- Publication number 20200211818
- Publication date Jul 2, 2020
- ASML NETHERLANDS B.V.
- Weihua YIN
- H01 - BASIC ELECTRIC ELEMENTS

Youfei JIANG

Person

Patents Grantslast 30 patents

Sample pre-charging methods and apparatuses for charged particle be...

System and method for scanning a sample using multi-beam inspection...

Method and system of image-forming multi-electron beams

Tilt-column multi-beam electron microscopy system and method

Bandpass charged particle energy filtering detector for charged par...

Sample pre-charging methods and apparatuses for charged particle be...

System and method for scanning a sample using multi-beam inspection...

In-lens wafer pre-charging and inspection with multiple beams

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECT...

TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD

METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS

Creating Multiple Electron Beams with a Photocathode Film

SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...

SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...

COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE...

BANDPASS CHARGED PARTICLE ENERGY FILTERING DETECTOR FOR CHARGED PAR...

ELECTRON SOURCE WITH MAGNETIC SUPPRESSOR ELECTRODE

IN-LENS WAFER PE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS

SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION...

SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...

IN-LENS WAFER PRE-CHARGING AND INSPECTION WITH MULTIPLE BEAMS