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Youichi Ogawa

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Patents Grantslast 30 patents

  • Information Patent Grant

    Eccentricity measuring method
    • Patent number 8,665,425
    • Issue date Mar 4, 2014
    • Konica Minolta Advanced Layers, Inc.
    • Kazuyuki Ogura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ECCENTRICITY MEASURING METHOD
    • Publication number 20130027692
    • Publication date Jan 31, 2013
    • Kazuyuki Ogura
    • G01 - MEASURING TESTING