Youichi Oshita

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Patents Grantslast 30 patents

Information Patent Grant
Contact abnormality detecting system
- Patent number 4,975,800
- Issue date Dec 4, 1990
- Hitachi, Ltd.
- Youichi Oshita
- G01 - MEASURING TESTING
Information Patent Grant
Puffer type current interrupter
- Patent number 4,442,330
- Issue date Apr 10, 1984
- Hitachi, Ltd.
- Youichi Oshita
- H01 - BASIC ELECTRIC ELEMENTS