Youji Nishiyama

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting bumps and determining height fr...
- Patent number 6,555,836
- Issue date Apr 29, 2003
- Fujitsu Limited
- Fumiyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for visual inspection of bump array
- Patent number 6,104,493
- Issue date Aug 15, 2000
- Fujitsu Limited
- Takashi Fuse
- G01 - MEASURING TESTING
Information Patent Grant
Height measurement device and height measurement method
- Patent number 6,052,189
- Issue date Apr 18, 2000
- Fujitsu Limited
- Takashi Fuse
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting height, and a height inspection apparatus to...
- Patent number 5,999,266
- Issue date Dec 7, 1999
- Fujitsu Limited
- Fumiyuki Takahashi
- G01 - MEASURING TESTING