Youling Lin

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Differential method for layer-to-layer registration
- Patent number 7,359,577
- Issue date Apr 15, 2008
- Yan Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection method utilizing ultraviolet light
- Patent number 7,206,442
- Issue date Apr 17, 2007
- Rudolph Technologies, Inc.
- David W. Herod
- G01 - MEASURING TESTING
Information Patent Grant
System and method for three-dimensional surface inspection
- Patent number 7,039,228
- Issue date May 2, 2006
- Rudolph Technologies, Inc.
- Ramakrishna Pattikonda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for performing optical inspection utilizing diffr...
- Patent number 6,864,971
- Issue date Mar 8, 2005
- ISOA, Inc.
- YouLing Lin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-wavelength, narrow-bandwidth detection...
- Patent number 6,847,443
- Issue date Jan 25, 2005
- Rudolph Technologies, Inc.
- David W. Herod
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting defects on a structure-bearing surf...
- Patent number 6,813,376
- Issue date Nov 2, 2004
- Rudolph Technologies, Inc.
- Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of optically inspecting structures on an object
- Patent number 6,487,307
- Issue date Nov 26, 2002
- ISOA, Inc.
- Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for classifying an anomaly
- Patent number 6,483,938
- Issue date Nov 19, 2002
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of optically inspecting surface structures on an...
- Patent number 6,292,260
- Issue date Sep 18, 2001
- ISOA, Inc.
- Youling Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for identifying defects in a semiconductor
- Patent number 6,292,582
- Issue date Sep 18, 2001
- YouLing Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of optically inspecting manufactured devices
- Patent number 6,246,788
- Issue date Jun 12, 2001
- ISOA, Inc.
- Ramakrishna Pattikonda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for knowledgebase generation and management
- Patent number 6,246,787
- Issue date Jun 12, 2001
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for circuit repair
- Patent number 6,205,239
- Issue date Mar 20, 2001
- Texas Instruments Incorporated
- YouLing Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for anomaly detection
- Patent number 6,091,846
- Issue date Jul 18, 2000
- Texas Instruments Incorporated
- YouLing Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for automatic knowlege-based object identifica...
- Patent number 6,014,461
- Issue date Jan 11, 2000
- Texas Instruments Incorporated
- Audrey Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for recognizing visual indicia
- Patent number 5,703,969
- Issue date Dec 30, 1997
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for aligning and measuring misregistration
- Patent number 5,696,835
- Issue date Dec 9, 1997
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for recognizing visual indicia
- Patent number 5,553,168
- Issue date Sep 3, 1996
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for image processing in symbolic space
- Patent number 5,515,453
- Issue date May 7, 1996
- Beacon System, Inc.
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Differential method for layer-to-layer registration
- Publication number 20060011823
- Publication date Jan 19, 2006
- Yan Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Youling Lin

Person

Patents Grantslast 30 patents

Differential method for layer-to-layer registration

Optical inspection method utilizing ultraviolet light

System and method for three-dimensional surface inspection

System and method for performing optical inspection utilizing diffr...

System and method for multi-wavelength, narrow-bandwidth detection...

System and method for detecting defects on a structure-bearing surf...

System and method of optically inspecting structures on an object

System and method for classifying an anomaly

System and method of optically inspecting surface structures on an...

Method and system for identifying defects in a semiconductor

System and method of optically inspecting manufactured devices

System and method for knowledgebase generation and management

System and method for circuit repair

Method and system for anomaly detection

Apparatus and method for automatic knowlege-based object identifica...

System and method for recognizing visual indicia

Apparatus and method for aligning and measuring misregistration

System and method for recognizing visual indicia

Apparatus and method for image processing in symbolic space

Patents Applicationslast 30 patents

Differential method for layer-to-layer registration