Youn Cheul Kim

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Wuhan, CN

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Patents Grantslast 30 patents

Information Patent Grant
3D NAND memory device and method of forming the same
- Patent number 11,616,077
- Issue date Mar 28, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D NAND memory device and method of forming the same
- Patent number 11,563,029
- Issue date Jan 24, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D NAND memory device and method of forming the same
- Patent number 11,088,166
- Issue date Aug 10, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for testing three-dimensional memory device
- Patent number 10,998,079
- Issue date May 4, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and method for testing three-dimensional memory device
- Patent number 10,679,721
- Issue date Jun 9, 2020
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NOVEL 3D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20230200074
- Publication date Jun 22, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL 3D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20210327900
- Publication date Oct 21, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL 3D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20210280606
- Publication date Sep 9, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20200411541
- Publication date Dec 31, 2020
- Yangtze Memory Technologies Co., Ltd.
- Jin Yong Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE
- Publication number 20200265913
- Publication date Aug 20, 2020
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE
- Publication number 20190057756
- Publication date Feb 21, 2019
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE