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Young-Chang Joo
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Sunnyvale, CA, US
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last 30 patents
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Patent Grant
Adhesion strength testing using a depth-sensing indentation technique
Patent number
6,339,958
Issue date
Jan 22, 2002
Advanced Micro Devices, Inc.
Ting Y. Tsui
G01 - MEASURING TESTING
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Patent Grant
Method for electronically measuring size of internal void in electr...
Patent number
6,242,924
Issue date
Jun 5, 2001
Advanced Micro Devices
Tsui Ting Yiu
G01 - MEASURING TESTING
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Patent Grant
Method for measuring fracture toughness of thin films
Patent number
6,053,034
Issue date
Apr 25, 2000
Advanced Micro Devices, Inc.
Ting Y. Tsui
B82 - NANO-TECHNOLOGY