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Young-Joon Park
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metal interconnect processing for an integrated circuit metal stack
Patent number
10,361,095
Issue date
Jul 23, 2019
Texas Instruments Incorporated
Abbas Ali
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metal interconnect processing for a non-reactive metal stack
Patent number
10,002,774
Issue date
Jun 19, 2018
Texas Instruments Incorporated
Abbas Ali
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
On-time based peak current density rule and design method
Patent number
9,157,938
Issue date
Oct 13, 2015
Texas Instruments Incorporated
Young-Joon Park
G01 - MEASURING TESTING
Information
Patent Grant
IC resistor formed with integral heatsinking structure
Patent number
9,111,779
Issue date
Aug 18, 2015
Texas Instruments Incorporated
Young-Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromigration compensation system
Patent number
8,677,303
Issue date
Mar 18, 2014
Texas Instruments Incorporated
Palkesh Jain
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Via-node-based electromigration rule-check methodology
Patent number
8,438,519
Issue date
May 7, 2013
Texas Instruments Incorporated
Young-Joon Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
IC devices having TSVS including protruding tips having IMC blockin...
Patent number
8,299,612
Issue date
Oct 30, 2012
Texas Instruments Incorporated
Jeffrey A. West
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Budgeting electromigration-related reliability among metal paths in...
Patent number
8,219,953
Issue date
Jul 10, 2012
Texas Instruments Incorporated
Palkesh Jain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
IC devices having TSVS including protruding tips having IMC blockin...
Patent number
8,039,385
Issue date
Oct 18, 2011
Texas Instruments Incorporated
Jeffrey A. West
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrically inactive via for electromigration reliability improvement
Patent number
7,566,652
Issue date
Jul 28, 2009
Texas Instruments Incorporated
Ki-Don Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selectively encased surface metal structures in a semiconductor device
Patent number
7,215,000
Issue date
May 8, 2007
Texas Instruments Incorporated
Richard A. Faust
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Two step semiconductor manufacturing process for copper interconnects
Patent number
7,122,466
Issue date
Oct 17, 2006
Texas Instruments Incorporated
Young-Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low stress integrated circuit copper interconnect structures
Patent number
6,762,501
Issue date
Jul 13, 2004
Texas Instruments Incorporated
Young-Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
STRAPPED COPPER INTERCONNECT FOR IMPROVED ELECTROMIGRATION RELIABILITY
Publication number
20210257312
Publication date
Aug 19, 2021
TEXAS INSTRUMENTS INCORPORATED
Jungwoo Joh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METAL INTERCONNECT PROCESSING FOR AN INTEGRATED CIRCUIT METAL STACK
Publication number
20190074193
Publication date
Mar 7, 2019
TEXAS INSTRUMENTS INCORPORATED
Abbas ALI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ON-TIME BASED PEAK CURRENT DENSITY RULE AND DESIGN METHOD
Publication number
20140129166
Publication date
May 8, 2014
TEXAS INSTRUMENTS INCORPORATED
YOUNG-JOON PARK
G01 - MEASURING TESTING
Information
Patent Application
IC DEVICES HAVING TSVS INCLUDING PROTRUDING TIPS HAVING IMC BLOCKIN...
Publication number
20120235296
Publication date
Sep 20, 2012
TEXAS INSTRUMENTS INCORPORATED
Jeffrey A. West
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMIGRATION COMPENSATION SYSTEM
Publication number
20110080175
Publication date
Apr 7, 2011
PALKESH JAIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IC RESISTOR FORMED WITH INTEGRAL HEATSINKING STRUCTURE
Publication number
20100032770
Publication date
Feb 11, 2010
TEXAS INSTRUMENTS INCORPORATED
Young-Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VIA-NODE-BASED ELECTROMIGRATION RULE-CHECK METHODOLOGY
Publication number
20090228856
Publication date
Sep 10, 2009
Texas Instruments Inc.
Young-Joon Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Budgeting Electromigration-Related Reliability Among Metal Paths In...
Publication number
20090187869
Publication date
Jul 23, 2009
TEXAS INSTRUMENTS INCORPORATED
Palkesh Jain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electrically inactive via for electromigration reliability improvement
Publication number
20080017989
Publication date
Jan 24, 2008
TEXAS INSTRUMENTS INCORPORATED
Ki-Don Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selectively encased surface metal structures in a semiconductor device
Publication number
20060038295
Publication date
Feb 23, 2006
Texas Instruments, Incorporated
Richard A. Faust
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Two step semiconductor manufacturing process for copper interconnects
Publication number
20050023688
Publication date
Feb 3, 2005
Young-Joon Park
H01 - BASIC ELECTRIC ELEMENTS