Youngchul LEE

Person

Asan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device including window for optical module
- Patent number 11,902,639
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Moohyun Baek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Micro-LED display and manufacturing method therefor
- Patent number 11,658,162
- Issue date May 23, 2023
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test board and test apparatus including a multi-type fluid supplier...
- Patent number 11,422,158
- Issue date Aug 23, 2022
- Samsung Electronics Co., Ltd.
- Hyeju Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 10,823,779
- Issue date Nov 3, 2020
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 9,995,787
- Issue date Jun 12, 2018
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Socket for testing a semiconductor device and test equipment includ...
- Patent number 9,360,499
- Issue date Jun 7, 2016
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 9,285,416
- Issue date Mar 15, 2016
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE INCLUDING WINDOW FOR OPTICAL MODULE
- Publication number 20220394157
- Publication date Dec 8, 2022
- Samsung Electronics Co., Ltd.
- Moohyun BAEK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MICRO-LED DISPLAY AND MANUFACTURING METHOD THEREFOR
- Publication number 20210375833
- Publication date Dec 2, 2021
- Samsung Electronics Co., LTD
- Youngchul LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST BOARD AND TEST APPARATUS FOR TESTING ELECTRONIC APPARATUSES HA...
- Publication number 20210172979
- Publication date Jun 10, 2021
- Samsung Electronics Co., Ltd.
- Hyeju Kim
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL ELEMENT TRANSFER APPARATUS
- Publication number 20210136966
- Publication date May 6, 2021
- Samsung Electronics Co., LTD
- Hyun-Tae JANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20180246164
- Publication date Aug 30, 2018
- SEMES CO., LTD.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20160154054
- Publication date Jun 2, 2016
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Application
SOCKET FOR TESTING A SEMICONDUCTOR DEVICE AND TEST EQUIPMENT INCLUD...
- Publication number 20140015559
- Publication date Jan 16, 2014
- Samsung Electronics Co., Ltd.
- Youngchul LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20130257471
- Publication date Oct 3, 2013
- Youngchul Lee
- G01 - MEASURING TESTING

Youngchul LEE

Person

Patents Grantslast 30 patents

Electronic device including window for optical module

Micro-LED display and manufacturing method therefor

Test board and test apparatus including a multi-type fluid supplier...

Apparatus and method for manufacturing substrates

Apparatus and method for manufacturing substrates

Socket for testing a semiconductor device and test equipment includ...

Apparatus and method for manufacturing substrates

Patents Applicationslast 30 patents

ELECTRONIC DEVICE INCLUDING WINDOW FOR OPTICAL MODULE

MICRO-LED DISPLAY AND MANUFACTURING METHOD THEREFOR

TEST BOARD AND TEST APPARATUS FOR TESTING ELECTRONIC APPARATUSES HA...

ELECTRICAL ELEMENT TRANSFER APPARATUS

APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES

APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES

SOCKET FOR TESTING A SEMICONDUCTOR DEVICE AND TEST EQUIPMENT INCLUD...

APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES