Younghoon Sohn

Person

Incheon, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Vibration isolation table for semiconductor equipment and vibration...
- Patent number 12,110,938
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Hyunchul Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and method of fabricating a semiconduct...
- Patent number 11,486,834
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor wafer, inspection system for per...
- Patent number 11,004,712
- Issue date May 11, 2021
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring misalignment of chips, a method of fabricating...
- Patent number 10,720,365
- Issue date Jul 21, 2020
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection system, and method of manufacturing s...
- Patent number 10,482,593
- Issue date Nov 19, 2019
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and method of fabricating sem...
- Patent number 10,460,436
- Issue date Oct 29, 2019
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring thickness
- Patent number 10,088,297
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Fan-out panel level package and method of fabricating the same
- Patent number 9,892,980
- Issue date Feb 13, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for inspecting semiconductor devices using...
- Patent number 9,267,903
- Issue date Feb 23, 2016
- Samsung Electronics Co., Ltd.
- Mira Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20250003734
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20240332093
- Publication date Oct 3, 2024
- Samsung Electronics Co., Ltd.
- In Seok PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME
- Publication number 20240295490
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Jaeho Kim
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20240255439
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Heeyoon Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME
- Publication number 20240255274
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Changi Jeon
- G01 - MEASURING TESTING
Information Patent Application
WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF
- Publication number 20240248051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...
- Publication number 20240241067
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Seungchul Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARAT...
- Publication number 20240035957
- Publication date Feb 1, 2024
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY...
- Publication number 20230384212
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Donghyun LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE TESTING APPARATUS AND METHODS OF TESTING AND F...
- Publication number 20230366853
- Publication date Nov 16, 2023
- Samsung Electronics Co., Ltd.
- SUNG YOON RYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...
- Publication number 20230184691
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Yusin YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD USING THE SAME, AND METH...
- Publication number 20230154804
- Publication date May 18, 2023
- Samsung Electronics Co., Ltd.
- Jaeho KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...
- Publication number 20230140892
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT DETECTION AND RANGING (LiDAR)-BASED INSPECTION DEVICE AND MET...
- Publication number 20230108333
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING SEMICONDUCTOR WAFER AND METHOD OF...
- Publication number 20230103349
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Q-Han PARK
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION ISOLATION TABLE FOR SEMICONDUCTOR EQUIPMENT AND VIBRATION...
- Publication number 20230079008
- Publication date Mar 16, 2023
- Samsung Electronics Co., Ltd.
- Hyunchul Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE
- Publication number 20210140899
- Publication date May 13, 2021
- Samsung Electronics Co., Ltd.
- Jangik PARK
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD AND METHOD OF FABRICATING A SEMICONDUCT...
- Publication number 20200209165
- Publication date Jul 2, 2020
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...
- Publication number 20200194294
- Publication date Jun 18, 2020
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
- Publication number 20200182783
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...
- Publication number 20200176292
- Publication date Jun 4, 2020
- Samsung Electronics Co,Ltd.
- Sung Yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF FABRICATING SEM...
- Publication number 20180101940
- Publication date Apr 12, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
- Publication number 20180096903
- Publication date Apr 5, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING MISALIGNMENT OF CHIPS, A METHOD OF FABRICATING...
- Publication number 20180025949
- Publication date Jan 25, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF MANUFACTURING S...
- Publication number 20180005369
- Publication date Jan 4, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS
- Publication number 20170363418
- Publication date Dec 21, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- G01 - MEASURING TESTING

Younghoon Sohn

Person

Patents Grantslast 30 patents

Vibration isolation table for semiconductor equipment and vibration...

Test apparatus and test method thereof

Substrate inspection method and method of fabricating a semiconduct...

Method of inspecting semiconductor wafer, inspection system for per...

Method of measuring misalignment of chips, a method of fabricating...

Inspection method, inspection system, and method of manufacturing s...

Inspection method, inspection system, and method of fabricating sem...

Apparatus and method for measuring thickness

Fan-out panel level package and method of fabricating the same

Methods and apparatuses for inspecting semiconductor devices using...

Patents Applicationslast 30 patents

MATERIAL MEASUREMENT SYSTEM AND METHOD

TEST APPARATUS AND TEST METHOD THEREOF

CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF

MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME

WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF

APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVIC...

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARAT...

INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY...

SEMICONDUCTOR DEVICE TESTING APPARATUS AND METHODS OF TESTING AND F...

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...

SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD USING THE SAME, AND METH...

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...

LIGHT DETECTION AND RANGING (LiDAR)-BASED INSPECTION DEVICE AND MET...

METHOD AND SYSTEM FOR INSPECTING SEMICONDUCTOR WAFER AND METHOD OF...

VIBRATION ISOLATION TABLE FOR SEMICONDUCTOR EQUIPMENT AND VIBRATION...

TEST APPARATUS AND TEST METHOD THEREOF

SUBSTRATE INSPECTION DEVICE

SUBSTRATE INSPECTION METHOD AND METHOD OF FABRICATING A SEMICONDUCT...

SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...

INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF FABRICATING SEM...

FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME

METHOD OF MEASURING MISALIGNMENT OF CHIPS, A METHOD OF FABRICATING...

INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF MANUFACTURING S...

APPARATUS AND METHOD FOR MEASURING THICKNESS