YOUNGKYU PARK

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NAM-GU, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a wafer and apparatus for performing the same
- Patent number 12,111,270
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of performing inspection and metrology pro...
- Patent number 10,732,129
- Issue date Aug 4, 2020
- SAMASUNG ELECTRONICS CO., LTD.
- Kwang Soo Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR ERROR RECOVERY AND METHOD OF OPERATING THE SAME
- Publication number 20250045149
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Jong Heon JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME
- Publication number 20230204422
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jinwoo Ahn
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROCESSING APPARATUS
- Publication number 20230207356
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Seungbeom PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME
- Publication number 20230104399
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR AND METHOD OF PERFORMING INSPECTION AND METROLOGY PRO...
- Publication number 20190376908
- Publication date Dec 12, 2019
- Sakmsung Electronics Co., Ltd.
- Kwang Soo Kim
- G01 - MEASURING TESTING
Information Patent Application
SURFACE LIGHT SOURCE USING ARRAYED POINT LIGHT SOURCES
- Publication number 20150308654
- Publication date Oct 29, 2015
- Samsung Electronics Co., Ltd.
- YOUNGKYU PARK
- F21 - LIGHTING