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Youngmin JHON
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Seoul, KR
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Patents Grants
last 30 patents
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Patent Grant
Slam method and apparatus robust to wireless environment change
Patent number
11,275,163
Issue date
Mar 15, 2022
Korea Institute of Science and Technology
Taikjin Lee
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for wireless localization of high accuracy
Patent number
10,746,847
Issue date
Aug 18, 2020
Korea Institute of Science and Technology
Taikjin Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SLAM METHOD AND APPARATUS ROBUST TO WIRELESS ENVIRONMENT CHANGE
Publication number
20200033463
Publication date
Jan 30, 2020
Korea Institute of Science and Technology
Taikjin LEE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR WIRELESS LOCALIZATION OF HIGH ACCURACY
Publication number
20190369205
Publication date
Dec 5, 2019
Korea Institute of Science and Technology
Taikjin LEE
G01 - MEASURING TESTING