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Youngok Kim
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Suwon-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor memory devices and methods of fabricating the same
Patent number
9,373,635
Issue date
Jun 21, 2016
Samsung Electronics Co., Ltd.
Won-Seok Jung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer test method and wafer test apparatus
Patent number
8,228,089
Issue date
Jul 24, 2012
Samsung Electronics Co., Ltd.
Youngok Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-volatile memory device and method for fabricating non-volatile...
Patent number
8,120,089
Issue date
Feb 21, 2012
Samsung Electronics Co., Ltd.
Young-Hoo Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating nonvolatile memory device
Patent number
8,076,198
Issue date
Dec 13, 2011
Samsung Electronics Co., Ltd.
Hyosan Lee
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor Memory Devices and Methods of Fabricating the Same
Publication number
20160104719
Publication date
Apr 14, 2016
Won-Seok Jung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER TEST METHOD AND WAFER TEST APPARATUS
Publication number
20100200431
Publication date
Aug 12, 2010
Youngok Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-VOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING NON-VOLATILE...
Publication number
20100181610
Publication date
Jul 22, 2010
SAMSUNG ELECTRONICS CO., LTD.
Young-Hoo Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of fabricating nonvolatile memory device
Publication number
20100178755
Publication date
Jul 15, 2010
Samsung Electronics Co., Ltd.
Hyosan Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Self-aligned contact method
Publication number
20060154460
Publication date
Jul 13, 2006
Serah Yun
H01 - BASIC ELECTRIC ELEMENTS