Younus Vora

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to reduce thermal stress by regulation and con...
- Patent number 9,534,848
- Issue date Jan 3, 2017
- KLA-Tencor Corporation
- Jincheng Wang
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Diode laser based broad band light sources for wafer inspection tools
- Patent number 9,110,037
- Issue date Aug 18, 2015
- KLA-Tencor Corporation
- Anant Chimmalgi
- G01 - MEASURING TESTING
Information Patent Grant
Diode laser based broad band light sources for wafer inspection tools
- Patent number 8,896,827
- Issue date Nov 25, 2014
- KLA-Tencor Corporation
- Anant Chimmalgi
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, computer-readable media, and systems...
- Patent number 8,073,240
- Issue date Dec 6, 2011
- KLA-Tencor Corp.
- Verlyn Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging dense linewidth features using an...
- Patent number 5,386,317
- Issue date Jan 31, 1995
- Prometrix Corporation
- Timothy R. Corle
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DIODE LASER BASED BROAD BAND LIGHT SOURCES FOR WAFER INSPECTION TOOLS
- Publication number 20150042979
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Anant Chimmalgi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus to Reduce Thermal Stress by Regulation and Con...
- Publication number 20140060792
- Publication date Mar 6, 2014
- KLA-Tencor Corporation
- Jincheng Wang
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
DIODE LASER BASED BROAD BAND LIGHT SOURCES FOR WAFER INSPECTION TOOLS
- Publication number 20130342825
- Publication date Dec 26, 2013
- Anant Chimmalgi
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS...
- Publication number 20080279444
- Publication date Nov 13, 2008
- Verlyn Fischer
- G01 - MEASURING TESTING