Yousuke Irie

Person

Kadoma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Stress analysis device for moving body
- Patent number 12,092,538
- Issue date Sep 17, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress analysis device
- Patent number 12,073,549
- Issue date Aug 27, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress properties measurement method, device, and system correlated...
- Patent number 12,066,343
- Issue date Aug 20, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,965,735
- Issue date Apr 23, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Stress distribution measurement method and stress distribution meas...
- Patent number 11,906,370
- Issue date Feb 20, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress distribution image processing device
- Patent number 11,808,657
- Issue date Nov 7, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Stress measurement device, stress measurement system, and stress me...
- Patent number 11,761,833
- Issue date Sep 19, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Stress measurement method, stress measurement device, and stress me...
- Patent number 11,467,046
- Issue date Oct 11, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fatigue limit stress specification system, fatigue limit stress spe...
- Patent number 11,275,005
- Issue date Mar 15, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,054,252
- Issue date Jul 6, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress distribution measurement method and stress distribution meas...
- Patent number 10,900,844
- Issue date Jan 26, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress measurement device, stress measurement system, and stress me...
- Patent number 10,830,652
- Issue date Nov 10, 2020
- PANASONIC INTELLECTUAL PROPRETY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Cleaning method and cleaning apparatus
- Patent number 7,507,297
- Issue date Mar 24, 2009
- Panasonic Corporation
- Yousuke Irie
- B08 - CLEANING
Information Patent Grant
Head support mechanism, information recording/reproducing apparatus...
- Patent number 6,943,990
- Issue date Sep 13, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kazuo Yokoyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Piezoelectric element, actuator, and inkjet head
- Patent number 6,903,491
- Issue date Jun 7, 2005
- Matsushita Electric Industrial Co., Ltd.
- Yousuke Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Actuator with piezoelectric member
- Patent number 6,724,580
- Issue date Apr 20, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yousuke Irie
- G11 - INFORMATION STORAGE
Information Patent Grant
Thin film magnetic head
- Patent number 6,400,537
- Issue date Jun 4, 2002
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistance effect device, and magnetoresistaance effect type...
- Patent number 6,256,222
- Issue date Jul 3, 2001
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistance effect device, and magnetoresistance effect type...
- Patent number 6,111,782
- Issue date Aug 29, 2000
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thin film magnetic head
- Patent number 6,084,752
- Issue date Jul 4, 2000
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistance effect device, and magnetoresistance effect type...
- Patent number 6,005,798
- Issue date Dec 21, 1999
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistance effect device and magnetoresistance effect type h...
- Patent number 5,841,611
- Issue date Nov 24, 1998
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistance element, magnetoresistive head and magnetoresisti...
- Patent number 5,715,121
- Issue date Feb 3, 1998
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetoresistive element and memory element
- Patent number 5,691,936
- Issue date Nov 25, 1997
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Memory element
- Patent number 5,459,687
- Issue date Oct 17, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hiroshi Sakakima
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20240219175
- Publication date Jul 4, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS DISTRIBUTION IMAGE PROCESSING DEVICE
- Publication number 20220187162
- Publication date Jun 16, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS ANALYSIS DEVICE
- Publication number 20220180502
- Publication date Jun 9, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRESS ANALYSIS DEVICE FOR MOVING BODY
- Publication number 20220082460
- Publication date Mar 17, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRESS PROPERTIES MEASUREMENT METHOD, STRESS PROPERTIES MEASUREMENT...
- Publication number 20210404894
- Publication date Dec 30, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- YOUSUKE IRIE
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20210364282
- Publication date Nov 25, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS DISTRIBUTION MEASUREMENT METHOD AND STRESS DISTRIBUTION MEAS...
- Publication number 20210102846
- Publication date Apr 8, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRESS MEASUREMENT DEVICE, STRESS MEASUREMENT SYSTEM, AND STRESS ME...
- Publication number 20210048356
- Publication date Feb 18, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- YOUSUKE IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS MEASUREMENT METHOD, STRESS MEASUREMENT DEVICE, AND STRESS ME...
- Publication number 20190353538
- Publication date Nov 21, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FATIGUE LIMIT STRESS SPECIFICATION SYSTEM, FATIGUE LIMIT STRESS SPE...
- Publication number 20190310174
- Publication date Oct 10, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS MEASUREMENT DEVICE, STRESS MEASUREMENT SYSTEM, AND STRESS ME...
- Publication number 20190107448
- Publication date Apr 11, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- YOUSUKE IRIE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20180372487
- Publication date Dec 27, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS DISTRIBUTION MEASUREMENT METHOD AND STRESS DISTRIBUTION MEAS...
- Publication number 20180348064
- Publication date Dec 6, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Washing method and washing device
- Publication number 20050199263
- Publication date Sep 15, 2005
- Yousuke Irie
- B08 - CLEANING
Information Patent Application
Optical switch and production method therefor, information transmis...
- Publication number 20050094931
- Publication date May 5, 2005
- Kazuo Yokoyama
- G02 - OPTICS
Information Patent Application
Piezoelectric element, actuator, and inkjet head
- Publication number 20020180843
- Publication date Dec 5, 2002
- Yousuke Irie
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Actuator, information recording/reproducing device, and method of m...
- Publication number 20010046107
- Publication date Nov 29, 2001
- Yousuke Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM MAGNETIC HEAD
- Publication number 20010012186
- Publication date Aug 9, 2001
- HIROSHI SAKAKIMA
- B82 - NANO-TECHNOLOGY

Yousuke Irie

Person

Patents Grantslast 30 patents

Stress analysis device for moving body

Stress analysis device

Stress properties measurement method, device, and system correlated...

Thickness measurement method, thickness measurement device, defect...

Stress distribution measurement method and stress distribution meas...

Stress distribution image processing device

Stress measurement device, stress measurement system, and stress me...

Stress measurement method, stress measurement device, and stress me...

Fatigue limit stress specification system, fatigue limit stress spe...

Thickness measurement method, thickness measurement device, defect...

Stress distribution measurement method and stress distribution meas...

Stress measurement device, stress measurement system, and stress me...

Cleaning method and cleaning apparatus

Head support mechanism, information recording/reproducing apparatus...

Piezoelectric element, actuator, and inkjet head

Actuator with piezoelectric member

Thin film magnetic head

Magnetoresistance effect device, and magnetoresistaance effect type...

Magnetoresistance effect device, and magnetoresistance effect type...

Thin film magnetic head

Magnetoresistance effect device, and magnetoresistance effect type...

Magnetoresistance effect device and magnetoresistance effect type h...

Magnetoresistance element, magnetoresistive head and magnetoresisti...

Magnetoresistive element and memory element

Memory element

Patents Applicationslast 30 patents

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

STRESS DISTRIBUTION IMAGE PROCESSING DEVICE

STRESS ANALYSIS DEVICE

STRESS ANALYSIS DEVICE FOR MOVING BODY

STRESS PROPERTIES MEASUREMENT METHOD, STRESS PROPERTIES MEASUREMENT...

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

STRESS DISTRIBUTION MEASUREMENT METHOD AND STRESS DISTRIBUTION MEAS...

STRESS MEASUREMENT DEVICE, STRESS MEASUREMENT SYSTEM, AND STRESS ME...

STRESS MEASUREMENT METHOD, STRESS MEASUREMENT DEVICE, AND STRESS ME...

FATIGUE LIMIT STRESS SPECIFICATION SYSTEM, FATIGUE LIMIT STRESS SPE...

STRESS MEASUREMENT DEVICE, STRESS MEASUREMENT SYSTEM, AND STRESS ME...

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

STRESS DISTRIBUTION MEASUREMENT METHOD AND STRESS DISTRIBUTION MEAS...

Washing method and washing device

Optical switch and production method therefor, information transmis...

Piezoelectric element, actuator, and inkjet head

Actuator, information recording/reproducing device, and method of m...

THIN FILM MAGNETIC HEAD