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Yousuke Kuroiwa
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Osaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Test circuit and test method that includes supplying a current to a...
Patent number
7,545,156
Issue date
Jun 9, 2009
Panasonic Corporation
Yousuke Kuroiwa
G01 - MEASURING TESTING
Information
Patent Grant
Amplifier unit and optical disc drive
Patent number
7,391,265
Issue date
Jun 24, 2008
Matsushita Electric Industrial Co., Ltd.
Shinichi Miyamoto
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TEST CIRCUIT AND OPTICAL PICKUP DEVICE
Publication number
20100283474
Publication date
Nov 11, 2010
PANASONIC CORPORATION
Hideo FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
TEST CIRCUIT AND TEST METHOD
Publication number
20070252602
Publication date
Nov 1, 2007
Matsushita Electric Industrial Co., Ltd.
Yousuke KUROIWA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Amplifier unit and optical disc drive
Publication number
20060202761
Publication date
Sep 14, 2006
Matsushita Electric Industrial Co., Ltd.
Shinichi Miyamoto
H03 - BASIC ELECTRONIC CIRCUITRY