YOUVAL NEHMADI

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic inline yield analysis and prediction of a defect limited yi...
- Patent number 7,937,179
- Issue date May 3, 2011
- Applied Materials, Inc.
- Rinat Shimshi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Grouping systematic defects with feedback from electrical inspection
- Patent number 7,760,929
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Jacob J. Orbon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Design-based method for grouping systematic defects in lithography...
- Patent number 7,760,347
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
GROUPING SYSTEMATIC DEFECTS WITH FEEDBACK FROM ELECTRICAL INSPECTION
- Publication number 20070052963
- Publication date Mar 8, 2007
- JACOB J. ORBON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DESIGN-BASED METHOD FOR GROUPING SYSTEMATIC DEFECTS IN LITHOGRAPHY...
- Publication number 20060269120
- Publication date Nov 30, 2006
- YOUVAL NEHMADI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY