Youval Nehmadi

Person

Moddin, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining factors for design considerati...
- Patent number 8,924,904
- Issue date Dec 30, 2014
- Applied Materials, Inc.
- Vicky Svidenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inline defect analysis for sampling and SPC
- Patent number 8,799,831
- Issue date Aug 5, 2014
- Applied Materials, Inc.
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Grant
Stage yield prediction
- Patent number 7,962,864
- Issue date Jun 14, 2011
- Applied Materials, Inc.
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer software product for inspecting charged...
- Patent number 7,856,138
- Issue date Dec 21, 2010
- Applied Materials Israel, Ltd.
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Grant
Process monitoring system and method for processing a large number...
- Patent number 7,587,700
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Grant
Design-based monitoring
- Patent number 7,135,344
- Issue date Nov 14, 2006
- Applied Materials, Israel, Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DESIGN-BASED MONITORING
- Publication number 20090007030
- Publication date Jan 1, 2009
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Stage yield prediction
- Publication number 20080295047
- Publication date Nov 27, 2008
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inline defect analysis for sampling and SPC
- Publication number 20080295048
- Publication date Nov 27, 2008
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining factors for design considerati...
- Publication number 20080295063
- Publication date Nov 27, 2008
- Vicky Svidenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic inline yield analysis and prediction
- Publication number 20080294281
- Publication date Nov 27, 2008
- Rinat Shimshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process monitoring system and method
- Publication number 20080092088
- Publication date Apr 17, 2008
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Application
System, method and computer software product for inspecting charged...
- Publication number 20060266833
- Publication date Nov 30, 2006
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Application
Design-based monitoring
- Publication number 20050010890
- Publication date Jan 13, 2005
- Applied Materials Israel Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Youval Nehmadi

Person

Patents Grantslast 30 patents

Method and apparatus for determining factors for design considerati...

Inline defect analysis for sampling and SPC

Stage yield prediction

System, method and computer software product for inspecting charged...

Process monitoring system and method for processing a large number...

Design-based monitoring

Patents Applicationslast 30 patents

DESIGN-BASED MONITORING

Stage yield prediction

Inline defect analysis for sampling and SPC

Method and apparatus for determining factors for design considerati...

Dynamic inline yield analysis and prediction

Process monitoring system and method

System, method and computer software product for inspecting charged...

Design-based monitoring