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Ytzhak Rosenthal
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Neve Monoson, IL
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Patent Grant
Device and method for testing a device
Patent number
8,302,065
Issue date
Oct 30, 2012
FREESCALE SEMICONDUCTOR, INC.
Oshri Shomrony
G01 - MEASURING TESTING
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Patent Application
DEVICE AND METHOD FOR TESTING A DEVICE
Publication number
20090206866
Publication date
Aug 20, 2009
FREESCALE SEMICONDUCTOR, INC.
Oshri Shomrony
G01 - MEASURING TESTING